18318655. CONTROLLER, STORAGE DEVICE AND TEST SYSTEM simplified abstract (SK hynix Inc.)
CONTROLLER, STORAGE DEVICE AND TEST SYSTEM
Organization Name
Inventor(s)
Seung Hwa Baek of Icheon-si (KR)
CONTROLLER, STORAGE DEVICE AND TEST SYSTEM - A simplified explanation of the abstract
This abstract first appeared for US patent application 18318655 titled 'CONTROLLER, STORAGE DEVICE AND TEST SYSTEM
Simplified Explanation: The patent application describes a storage device that can operate in either host mode or device mode, allowing for the transmission and reception of information units between two storage devices to conduct tests on the device operating in device mode.
Key Features and Innovation:
- Storage device can operate in host mode or device mode.
- Allows for testing of storage devices in development.
- Enables transmission and reception of information units between storage devices.
Potential Applications: This technology could be used in:
- Quality control testing of storage devices.
- Development and testing of new storage technologies.
- Data transfer and communication between storage devices.
Problems Solved:
- Facilitates efficient testing of storage devices.
- Streamlines the development process for storage technologies.
- Enhances communication capabilities between storage devices.
Benefits:
- Improved testing accuracy and reliability.
- Faster development cycles for storage technologies.
- Enhanced data transfer capabilities between storage devices.
Commercial Applications: Potential commercial uses include:
- Storage device manufacturing companies.
- Data centers and server farms.
- Electronics and technology companies.
Prior Art: Readers interested in prior art related to this technology could start by researching:
- Storage device testing methods.
- Communication protocols between storage devices.
Frequently Updated Research: Stay updated on the latest research related to storage device testing methods and communication protocols to ensure the most current information is utilized.
Questions about Storage Device Testing Technology: 1. What are the key differences between host mode and device mode in storage devices? 2. How does this technology improve the efficiency of storage device testing processes?
Original Abstract Submitted
A storage device operates in host mode or device mode, and the storage device operating in host mode may transmit and receive various information units with the storage device operating in device mode to perform tests on the storage device operating in device mode, thereby performing the test of a storage device in development.
