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18208943. FERROELECTRIC MEMORY DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)

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FERROELECTRIC MEMORY DEVICE

Organization Name

SAMSUNG ELECTRONICS CO., LTD.

Inventor(s)

Kiheun Lee of Suwon-si (KR)

Yongseok Kim of Suwon-si (KR)

Hyuncheol Kim of Suwon-si (KR)

Daewon Ha of Suwon-si (KR)

FERROELECTRIC MEMORY DEVICE - A simplified explanation of the abstract

This abstract first appeared for US patent application 18208943 titled 'FERROELECTRIC MEMORY DEVICE

Simplified Explanation

The abstract describes a ferroelectric memory device that consists of several layers, including a channel layer, a gate insulation layer, and a gate electrode layer. The gate insulation layer contains a ferroelectric inductive layer and a ferroelectric stack structure, which is arranged in a specific order or reverse order of a ferroelectric layer and a non-ferroelectric layer.

  • The patent application describes a new type of ferroelectric memory device.
  • The device includes a channel layer, gate insulation layer, and gate electrode layer.
  • The gate insulation layer contains a ferroelectric inductive layer and a ferroelectric stack structure.
  • The ferroelectric stack structure is stacked in a specific order or reverse order of a ferroelectric layer and a non-ferroelectric layer.

Potential applications of this technology:

  • Memory devices: The ferroelectric memory device can be used in various memory applications, such as computer systems, smartphones, and other electronic devices.
  • Data storage: The device can be utilized for storing and retrieving data in a fast and efficient manner.
  • Non-volatile memory: The ferroelectric memory can retain data even when power is turned off, making it suitable for non-volatile memory applications.

Problems solved by this technology:

  • Improved memory performance: The ferroelectric memory device offers enhanced performance in terms of read/write speed and data retention.
  • Reduced power consumption: The device consumes less power compared to traditional memory technologies, leading to energy savings.
  • Increased data storage density: The ferroelectric stack structure allows for higher data storage density, enabling more information to be stored in a smaller space.

Benefits of this technology:

  • Faster data access: The ferroelectric memory device provides faster access to stored data, improving overall system performance.
  • Lower power requirements: The device's reduced power consumption contributes to energy efficiency and longer battery life in portable devices.
  • Compact design: The higher data storage density achieved by the ferroelectric stack structure allows for smaller and more compact memory devices.


Original Abstract Submitted

A ferroelectric memory device includes a channel layer, a gate insulation layer on the channel layer, and a gate electrode layer on the gate insulation layer. The gate insulation layer includes a ferroelectric inductive layer and a ferroelectric stack structure on the ferroelectric inductive layer, and the ferroelectric stack structure is stacked in an order or reverse order of a ferroelectric layer and a non-ferroelectric layer.

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