18170502. SPURIOUS-DATA-BASED DETECTION RELATED TO MALICIOUS ACTIVITY simplified abstract (Capital One Services, LLC)
SPURIOUS-DATA-BASED DETECTION RELATED TO MALICIOUS ACTIVITY
Organization Name
Inventor(s)
Galen Rafferty of Mahomet IL (US)
Samuel Sharpe of Cambridge MA (US)
Brian Barr of Schenectady NY (US)
Jeremy Goodsitt of Champaign IL (US)
Michael Davis of Arlington VA (US)
Taylor Turner of Richmond VA (US)
Justin Au-yeung of Somerville MA (US)
Owen Reinert of Queens NY (US)
SPURIOUS-DATA-BASED DETECTION RELATED TO MALICIOUS ACTIVITY - A simplified explanation of the abstract
This abstract first appeared for US patent application 18170502 titled 'SPURIOUS-DATA-BASED DETECTION RELATED TO MALICIOUS ACTIVITY
In some aspects, a computing system obtains a first dataset containing original data samples and spurious data samples. The system may replace the spurious data samples based on a time period expiring and may receive an indication of a second dataset from a third-party device. If a subset of the second dataset corresponds to the replaced spurious data samples, the system can determine a time window for an incident.
- The computing system replaces spurious data samples in a dataset based on a time period expiring.
- It receives an indication of a second dataset from a third-party device.
- The system determines a time window for an incident by comparing samples from the second dataset to the replaced spurious data samples.
- The time window may correspond to a period before the replacement of spurious data samples.
- This technology helps in identifying incidents based on data samples and time windows.
- Potential Applications:**
- Data analysis and incident detection in various industries. - Improving data accuracy and reliability in datasets. - Enhancing cybersecurity measures by identifying potential threats.
- Problems Solved:**
- Efficient replacement of spurious data samples in datasets. - Timely detection of incidents based on data analysis. - Enhancing the overall quality of data sets.
- Benefits:**
- Improved data accuracy and reliability. - Enhanced incident detection capabilities. - Streamlined data analysis processes.
- Commercial Applications:**
Title: Incident Detection and Data Analysis Technology This technology can be used in cybersecurity firms, financial institutions, and research organizations to improve data analysis and incident detection capabilities. It can also be valuable in enhancing the overall quality and reliability of datasets in various industries.
- Questions about Incident Detection and Data Analysis Technology:**
1. How does this technology improve data accuracy and reliability? This technology enhances data accuracy and reliability by efficiently replacing spurious data samples and identifying incidents based on time windows and data analysis.
2. What industries can benefit from using this technology? Various industries such as cybersecurity, finance, and research can benefit from this technology by improving incident detection and data analysis processes.
Original Abstract Submitted
In some aspects, a computing system obtain a first dataset including a set of original data samples and a first set of spurious data samples. Based on a time period expiring, the computing system may replace the first set of spurious data samples in the first dataset with a second set of spurious data samples. The computing system may obtain an indication that a second dataset is available via a third-party computing device. Based on a determination that a subset of samples of the second dataset correspond to the first set of spurious data samples, the computing system may determine a time window in which an incident occurred. As an example, the time window may be determined to correspond to a time before the first set of spurious data samples were replaced with the second set of spurious data samples.
- Capital One Services, LLC
- Galen Rafferty of Mahomet IL (US)
- Samuel Sharpe of Cambridge MA (US)
- Brian Barr of Schenectady NY (US)
- Jeremy Goodsitt of Champaign IL (US)
- Michael Davis of Arlington VA (US)
- Taylor Turner of Richmond VA (US)
- Justin Au-yeung of Somerville MA (US)
- Owen Reinert of Queens NY (US)
- G06F21/55
- G06F21/56
- CPC G06F21/554