18058740. TESTING METHOD AND TESTING SYSTEM simplified abstract (NANYA TECHNOLOGY CORPORATION)
TESTING METHOD AND TESTING SYSTEM
Organization Name
Inventor(s)
Wei-Chun Chen of Changhua County (TW)
TESTING METHOD AND TESTING SYSTEM - A simplified explanation of the abstract
This abstract first appeared for US patent application 18058740 titled 'TESTING METHOD AND TESTING SYSTEM
Simplified Explanation
The testing method described in the abstract involves accessing a memory chip to put it into a write leveling mode, inputting a strobe signal, adjusting signal edges, generating a data signal, and determining the types of memory chip based on the data signal.
- Accessing memory chip to put it into a write leveling mode
- Inputting a strobe signal into the memory chip
- Adjusting signal edges of the strobe signal to sample a clock state
- Generating a data signal according to the strobe signal
- Determining types of memory chip according to the data signal
Potential Applications
This technology could be applied in the semiconductor industry for testing and categorizing memory chips based on their performance characteristics.
Problems Solved
This technology helps in efficiently determining the types of memory chips, which can be crucial for quality control and performance optimization in electronic devices.
Benefits
The method provides a systematic approach to testing memory chips, ensuring accurate classification and potentially improving overall product quality.
Potential Commercial Applications
- Semiconductor manufacturing industry for quality control
- Electronics companies for optimizing memory chip performance
Possible Prior Art
One possible prior art could be methods for testing memory chips using different signal processing techniques.
Unanswered Questions
How does this method compare to traditional memory chip testing techniques?
The article does not provide a direct comparison between this method and traditional testing techniques.
Are there any limitations to the types of memory chips that can be tested using this method?
The article does not address any potential limitations in terms of the compatibility of this method with different types of memory chips.
Original Abstract Submitted
A testing method includes the following steps of: accessing a memory chip to put the memory chip into a write leveling mode; inputting a strobe signal into the memory chip under the write leveling mode; adjusting signal edges of the strobe signal to sample a clock state of a clock signal in the memory chip under the write leveling mode; generating a data signal according to the strobe signal under the write leveling mode; and determining types of the memory chip according to the data signal under the write leveling mode.
