17979226. IMAGE-SENSOR-BASED SCATTERING MEASUREMENT SYSTEM AND METHOD (Meta Platforms Technologies, LLC)
IMAGE-SENSOR-BASED SCATTERING MEASUREMENT SYSTEM AND METHOD
Organization Name
Meta Platforms Technologies, LLC
Inventor(s)
IMAGE-SENSOR-BASED SCATTERING MEASUREMENT SYSTEM AND METHOD
This abstract first appeared for US patent application 17979226 titled 'IMAGE-SENSOR-BASED SCATTERING MEASUREMENT SYSTEM AND METHOD
Original Abstract Submitted
A system is provided. The system includes a light source configured to emit a probing beam to illuminate an optical element. The system also includes an image sensor configured to be rotatable around the optical element within a predetermined rotation range. The system also includes a controller configured to control the image senor to move to a plurality of angular sub-ranges of the predetermined rotation range to receive a plurality of scattered beams output from the optical element. The image sensor is configured to generate a plurality of sets of speckle pattern image data based on the received scattered beams. The sets of speckle pattern image data provide two-dimensional (“2D”) spatial information of speckles.
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