17972224. MEMORY DEVICE AND METHOD OF OPERATING THE SAME simplified abstract (SK hynix Inc.)
MEMORY DEVICE AND METHOD OF OPERATING THE SAME
Organization Name
Inventor(s)
Jong Kyung Park of Icheon-si Gyeonggi-do (KR)
Jae Yeop Jung of Icheon-si Gyeonggi-do (KR)
Dong Hun Kwak of Icheon-si Gyeonggi-do (KR)
MEMORY DEVICE AND METHOD OF OPERATING THE SAME - A simplified explanation of the abstract
This abstract first appeared for US patent application 17972224 titled 'MEMORY DEVICE AND METHOD OF OPERATING THE SAME
Simplified Explanation
The abstract describes a memory device and a method of operating it. Here is a simplified explanation of the abstract:
- The memory device consists of multiple memory cell strings, a peripheral circuit, and an operation controller.
- The peripheral circuit is responsible for performing read operations on selected memory cells using different read voltages.
- The operation controller controls the peripheral circuit to perform the read operation using a first read voltage, a first potential adjustment operation, and then a second read voltage that is lower than the first read voltage.
- The first potential adjustment operation involves applying a first turn-on voltage to unselected source select lines connected to unselected memory cell strings for a specific period and then applying a ground voltage to those unselected source select lines.
Potential applications of this technology:
- Memory devices using this method can be used in various electronic devices such as smartphones, tablets, and computers.
- It can be applied in data storage systems, improving the performance and efficiency of memory operations.
Problems solved by this technology:
- The method allows for more efficient read operations by using different read voltages and a potential adjustment operation.
- It helps to reduce power consumption and improve the overall performance of the memory device.
Benefits of this technology:
- Improved read operation efficiency and accuracy.
- Reduced power consumption.
- Enhanced performance and reliability of memory devices.
Original Abstract Submitted
Provided herein may be a memory device and a method of operating the same. The memory device may include a plurality of memory cell strings, a peripheral circuit configured to, using a plurality of read voltages, perform a read operation that reads data that is stored in a selected memory cell that is included in a selected memory cell string, and an operation controller configured to control the peripheral circuit to perform the read operation by using a first read voltage, a first potential adjustment operation, and the read operation by using a second read voltage that is lower than the first read voltage, wherein the first potential adjustment operation is an operation that applies a first turn-on voltage to unselected source select lines that are coupled to unselected memory cell strings for a first period and thereafter applies a ground voltage to the unselected source select lines.