17949867. TESTING OPERATIONS FOR MEMORY SYSTEMS simplified abstract (Micron Technology, Inc.)
TESTING OPERATIONS FOR MEMORY SYSTEMS
Organization Name
Inventor(s)
Sujeet V. Ayyapureddi of Boise ID (US)
TESTING OPERATIONS FOR MEMORY SYSTEMS - A simplified explanation of the abstract
This abstract first appeared for US patent application 17949867 titled 'TESTING OPERATIONS FOR MEMORY SYSTEMS
Simplified Explanation
The patent application describes methods, systems, and devices for testing operations for memory systems, specifically focusing on validating counters tracking the quantity of activates to rows of memory cells. The system includes a first circuit to validate the counter value using parity bits and a second circuit to ensure the counter is incrementing correctly based on the quantity of activates to the corresponding memory cell row. If an error is detected, the system will discard the faulty memory cell row.
- Memory system testing operations for counters tracking memory cell activates
- First circuit validates counter value using parity bits
- Second circuit ensures counter is incrementing correctly based on activates
- Faulty counters result in discarding associated memory cell rows
Potential Applications
The technology can be applied in:
- Memory system manufacturing
- Quality control in memory systems
- Data center operations
Problems Solved
The technology addresses issues such as:
- Ensuring accurate tracking of memory cell activates
- Detecting errors in memory system counters
- Improving overall memory system reliability
Benefits
The benefits of this technology include:
- Enhanced memory system performance
- Increased reliability in memory operations
- Streamlined testing processes
Potential Commercial Applications
The technology can be commercially benefit:
- Memory system manufacturers
- Data centers
- Tech companies specializing in memory solutions
Possible Prior Art
One possible prior art could be the use of parity bits in memory systems to validate data integrity. Another could be the testing of memory system counters for accuracy in tracking memory cell activates.
Unanswered Questions
How does this technology compare to existing memory system testing methods?
This article does not provide a direct comparison with existing memory system testing methods. It would be beneficial to understand the specific advantages and disadvantages of this new approach compared to traditional methods.
What are the potential limitations or challenges of implementing this technology in memory systems?
The article does not address any potential limitations or challenges that may arise when implementing this technology in memory systems. It would be important to explore factors such as cost, complexity, and compatibility with existing systems.
Original Abstract Submitted
Methods, systems, and devices for testing operations for memory systems are described. A memory system may include a first circuit and a second circuit configured to test one or more counters tracking the quantity of activates to respective rows of memory cells. In some examples, the memory system may initiate an operation to validate a counter of the memory system. The first circuit may determine if a value of the counter is correct by comparing a set of counter bits representing the value of the counter to a set of parity bits. Subsequently, the second circuit may determine if the counter is incrementing correctly in accordance with a set quantity of activates to the corresponding row of memory cells. If the first circuit or the second circuit detect an error associated with the counter, the memory system may discard the row of memory cells associated with the faulty counter.
