17870096. STORAGE CONTROLLER AND ELECTRONIC SYSTEM simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)

STORAGE CONTROLLER AND ELECTRONIC SYSTEM

Organization Name

SAMSUNG ELECTRONICS CO., LTD.

Inventor(s)

Junyong Uhm of Seoul (KR)

Eunjoo Oh of Suwon-si (KR)

Junggyu Kim of Hwaseong-si (KR)

Jaesub Kim of Seoul (KR)

Yangwoo Roh of Hwaseong-si (KR)

Jeongbeom Seo of Seoul (KR)

Jaewon Song of Hwaseong-si (KR)

STORAGE CONTROLLER AND ELECTRONIC SYSTEM - A simplified explanation of the abstract

This abstract first appeared for US patent application 17870096 titled 'STORAGE CONTROLLER AND ELECTRONIC SYSTEM

Simplified Explanation

The abstract describes an electronic system that includes a host and a storage device. The host sends a fault insertion command to the storage device, specifying a fault type, target location, and fault condition. The storage device performs a fault detection operation on the target location based on the fault type and stores a snapshot when the fault condition is detected. The host can then obtain the snapshot and debug the storage device.

• The electronic system includes a host and a storage device.
• The host sends a fault insertion command to the storage device.
• The fault insertion command includes a fault type, target location, and fault condition.
• The storage device performs a fault detection operation on the target location.
• The fault detection operation is selected based on the fault type.
• The storage device stores a snapshot when the fault condition is detected.
• The host can obtain the stored snapshot using an interface protocol.
• The host can debug the storage device using the obtained snapshot.

Potential Applications

• Debugging and troubleshooting electronic systems.
• Testing and validating storage devices.
• Improving the reliability and performance of storage devices.

Problems Solved

• Facilitates fault detection and debugging of storage devices.
• Provides a mechanism for capturing snapshots of storage devices during fault conditions.
• Enables efficient testing and validation of storage devices.

Benefits

• Streamlines the debugging process for storage devices.
• Reduces the time and effort required to identify and fix faults.
• Enhances the reliability and performance of storage devices.

Original Abstract Submitted

An electronic system includes: a host; and a storage device configured to exchange data with the host using an interface protocol. The host provides a fault insertion command, including a fault type, a target location, and a fault condition, to the storage device, based on the interface protocol. The storage device performs a fault detection operation, selected based on the fault type among an assert code execution operation, a memory polling operation, an interrupt polling operation, and a latency detection operation, on the target location in response to the fault insertion command, and stores a snapshot of the storage device when the fault condition is detected as a result of performing the fault detection operation. The host obtains the stored snapshot using the interface protocol, and debugs the storage device using the obtained snapshot.