17760495. SCAN CIRCUIT AND DISPLAY APPARATUS simplified abstract (BOE TECHNOLOGY GROUP CO., LTD.)
SCAN CIRCUIT AND DISPLAY APPARATUS
Organization Name
BOE TECHNOLOGY GROUP CO., LTD.
Inventor(s)
SCAN CIRCUIT AND DISPLAY APPARATUS - A simplified explanation of the abstract
This abstract first appeared for US patent application 17760495 titled 'SCAN CIRCUIT AND DISPLAY APPARATUS
Simplified Explanation
The patent application describes a scan circuit with multiple stages, each containing a second processing subcircuit with specific components like capacitors and transistors.
- The scan circuit includes multiple stages, each with a second processing subcircuit.
- Each stage consists of a first capacitor, a sixth transistor, and a seventh transistor.
- A connecting line links the components together within each stage.
- The connecting line crosses over the capacitor electrodes to facilitate circuit operation.
Key Features and Innovation
- Inclusion of a second processing subcircuit in each stage of the scan circuit.
- Use of capacitors, transistors, and connecting lines to enable data processing.
- Cross-over design of the connecting line for efficient circuit operation.
Potential Applications
The technology can be applied in various fields such as integrated circuits, semiconductor manufacturing, and electronic devices requiring data scanning capabilities.
Problems Solved
- Enhanced data processing efficiency in scan circuits.
- Improved circuit design for better performance and functionality.
Benefits
- Increased speed and accuracy in data scanning processes.
- Higher reliability and stability in circuit operation.
- Potential for miniaturization and cost-effectiveness in electronic devices.
Commercial Applications
- Title: "Advanced Scan Circuit Technology for Improved Data Processing"
- This technology can be utilized in industries like telecommunications, consumer electronics, and automotive for faster and more reliable data scanning.
- Market implications include improved product performance, reduced manufacturing costs, and increased competitiveness in the market.
Prior Art
Information on prior art related to this technology is not provided in the abstract.
Frequently Updated Research
There is no information on frequently updated research relevant to this technology.
Questions about Scan Circuit Technology
Question 1
How does the cross-over design of the connecting line contribute to the efficiency of the scan circuit operation?
The cross-over design of the connecting line helps reduce interference and improve signal transmission between components within each stage, enhancing the overall performance of the scan circuit.
Question 2
What are the potential challenges in implementing this advanced scan circuit technology in real-world applications?
Implementing this technology may require specialized manufacturing processes and expertise, as well as compatibility with existing electronic systems. Additionally, ensuring reliability and scalability in different applications could be key challenges to address.
Original Abstract Submitted
A scan circuit is provided. The scan circuit includes a plurality of stages. A respective stage of the scan circuit includes a second processing subcircuit, which includes a first capacitor, a sixth transistor, and a seventh transistor. The respective stage of the scan circuit further includes a sixth connecting line connecting a first electrode of the seventh transistor, a second electrode of the sixth transistor, and a second capacitor electrode of the first capacitor together. The sixth connecting line crosses over both the first capacitor electrode and the second capacitor electrode of the first capacitor.
