US Patent Application 18446562. Polymer Layer in Semiconductor Device and Method of Manufacture simplified abstract

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Polymer Layer in Semiconductor Device and Method of Manufacture

Organization Name

Taiwan Semiconductor Manufacturing Company, Ltd.

Inventor(s)

Sih-Hao Liao of New Taipei City (TW)

Yu-Hsiang Hu of Hsinchu (TW)

Hung-Jui Kuo of Hsinchu (TW)

Chen-Hua Yu of Hsinchu (TW)

Polymer Layer in Semiconductor Device and Method of Manufacture - A simplified explanation of the abstract

This abstract first appeared for US patent application 18446562 titled 'Polymer Layer in Semiconductor Device and Method of Manufacture

Simplified Explanation

The patent application describes a method of manufacturing a semiconductor device using a polymer mixture.

  • The method involves applying the polymer mixture onto a substrate.
  • A portion of the polymer mixture is exposed and developed to form a dielectric layer.
  • The developed dielectric layer is then cured to enhance its properties.
  • The polymer mixture consists of a polymer precursor, a photosensitizer, and a solvent.
  • The polymer precursor used in the mixture is a polyamic acid ester.


Original Abstract Submitted

A method of manufacturing a semiconductor device includes applying a polymer mixture over a substrate, exposing and developing at least a portion of the polymer mixture to form a developed dielectric, and curing the developed dielectric to form a dielectric layer. The polymer mixture includes a polymer precursor, a photosensitizer, and a solvent. The polymer precursor may be a polyamic acid ester.