US Patent Application 17831344. FIFO MEMORY ERROR CONDITION DETECTION simplified abstract

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FIFO MEMORY ERROR CONDITION DETECTION

Organization Name

Micron Technology, Inc.

Inventor(s)

Lance P. Johnson of Saint Paul MN (US)

FIFO MEMORY ERROR CONDITION DETECTION - A simplified explanation of the abstract

This abstract first appeared for US patent application 17831344 titled 'FIFO MEMORY ERROR CONDITION DETECTION

Simplified Explanation

The patent application describes an apparatus that includes circuitry and a FIFO memory.

  • The first circuitry writes data into the FIFO memory at a certain rate.
  • The second circuitry reads data from the FIFO memory at a different rate.
  • The third circuitry detects and indicates any error condition in the FIFO memory.
  • The error condition is determined based on the positions of the write and read pointers.
  • The apparatus helps in identifying and addressing any issues or inconsistencies in the FIFO memory operation.


Original Abstract Submitted

An apparatus can include first circuitry coupled to a FIFO memory. The first circuitry can provide a write pointer of the FIFO memory at a first rate. Second circuitry can be coupled to the FIFO memory. The second circuitry can provide a read pointer of the FIFO memory at a second rate that is different from the first rate. Third circuitry can be coupled to the first and second circuitries. The third circuitry can provide an indication of an error condition of the FIFO memory based on the write pointer and the read pointer.

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