18539798. MULTI-SAMPLED, CHARGE-SHARING THERMOMETER IN MEMORY DEVICE simplified abstract (Micron Technology, Inc.)

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MULTI-SAMPLED, CHARGE-SHARING THERMOMETER IN MEMORY DEVICE

Organization Name

Micron Technology, Inc.

Inventor(s)

Agostino Macerola of San Benedetto dei Marsi (IT)

Gianni Rea of Avezzano (IT)

MULTI-SAMPLED, CHARGE-SHARING THERMOMETER IN MEMORY DEVICE - A simplified explanation of the abstract

This abstract first appeared for US patent application 18539798 titled 'MULTI-SAMPLED, CHARGE-SHARING THERMOMETER IN MEMORY DEVICE

Simplified Explanation

The memory device described in the abstract includes a diode with a threshold voltage that changes with temperature, an ADC, and a pulse generator. The ADC has a voltage comparator connected to the diode, along with capacitors that help equalize charge between them. The pulse generator generates pulses to control the charging and discharging of the capacitors.

  • The memory device includes an array of memory cells, a diode with a temperature-dependent threshold voltage, an ADC, and a pulse generator.
  • The ADC features a voltage comparator connected to the diode, along with capacitors that help equalize charge between them.
  • The pulse generator generates pulses to control the charging and discharging of the capacitors.

Potential Applications

The technology described in this patent application could be applied in:

  • Temperature-sensitive memory devices
  • Energy-efficient electronic systems
  • Sensor networks

Problems Solved

This technology helps address issues related to:

  • Temperature variations affecting memory cell performance
  • Energy consumption in electronic devices
  • Accuracy and reliability of sensor data

Benefits

The benefits of this technology include:

  • Improved memory cell stability in varying temperatures
  • Reduced power consumption in electronic systems
  • Enhanced accuracy and reliability of sensor data

Potential Commercial Applications

A potential commercial application for this technology could be in:

  • Smartphones and other mobile devices
  • Internet of Things (IoT) devices
  • Automotive electronics

Possible Prior Art

One possible prior art related to this technology is the use of temperature-compensated diodes in electronic circuits to maintain stability and accuracy.

Unanswered Questions

How does this technology compare to existing temperature-compensated memory devices on the market?

This article does not provide a direct comparison with existing temperature-compensated memory devices, so it is unclear how this technology differs or improves upon current solutions.

What are the specific temperature ranges in which this technology operates effectively?

The abstract does not mention the specific temperature ranges in which this technology operates effectively, leaving a gap in understanding its practical applications in different temperature environments.


Original Abstract Submitted

A memory device includes an array of memory cells, a diode having a threshold voltage that changes with temperature, an analog-to-digital converter (ADC), and a pulse generator. The ADC includes a voltage comparator having a positive terminal coupled with the diode. The ADC further includes a first capacitor coupled between a negative terminal of the voltage comparator and ground, and a second capacitor selectively coupled between the first capacitor and a voltage reference node. The second capacitor has a smaller capacitance than that of the first capacitor. The pulse generator is coupled with the ADC and generates pulses. The pulses cause the first capacitor to connect to the second capacitor and equalize charge between the first capacitor and the second capacitor. An inverted signal of the pulses causes the second capacitor to be coupled with the voltage reference node to pre-charge the first capacitor.