17948521. Memory Circuitry And Method Used In Forming Memory Circuitry simplified abstract (Micron Technology, Inc.)

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Memory Circuitry And Method Used In Forming Memory Circuitry

Organization Name

Micron Technology, Inc.

Inventor(s)

Andrew Li of Boise ID (US)

Sidhartha Gupta of Boise ID (US)

Adam W. Saxler of Boise ID (US)

Memory Circuitry And Method Used In Forming Memory Circuitry - A simplified explanation of the abstract

This abstract first appeared for US patent application 17948521 titled 'Memory Circuitry And Method Used In Forming Memory Circuitry

Simplified Explanation

The memory array in this patent application comprises strings of memory cells with laterally-spaced memory blocks, each consisting of a vertical stack of insulative and conductive tiers above a conductor tier. Channel-material strings extend through the insulative and conductive tiers in the memory blocks, directly electrically coupling to the conductor material. Intervening material is present between the memory blocks, including a laterally-outer insulative lining and laterally-inner insulating material. An interface exists between the outer insulative lining and the inner insulating material.

  • Memory array comprises strings of memory cells with memory blocks
  • Memory blocks have vertical stacks of insulative and conductive tiers
  • Channel-material strings extend through insulative and conductive tiers
  • Intervening material includes outer insulative lining and inner insulating material
  • Interface between outer insulative lining and inner insulating material

Potential Applications

This technology could be applied in:

  • High-density memory storage devices
  • Advanced computing systems
  • Data centers

Problems Solved

This technology helps to:

  • Increase memory array density
  • Improve data transfer speeds
  • Enhance overall system performance

Benefits

The benefits of this technology include:

  • Efficient use of space
  • Faster data access
  • Enhanced reliability and durability

Potential Commercial Applications

This technology could be commercially applied in:

  • Semiconductor manufacturing
  • Electronics industry
  • Information technology sector

Possible Prior Art

One possible prior art for this technology could be:

  • Memory arrays with vertical stacking of memory blocks

Unanswered Questions

How does this technology compare to existing memory array designs?

This article does not provide a direct comparison to existing memory array designs, leaving the reader to wonder about the specific advantages and disadvantages of this innovation.

What are the potential limitations or challenges in implementing this technology?

The article does not address any potential limitations or challenges that may arise in implementing this technology, leaving room for further exploration into its practical applications and feasibility.


Original Abstract Submitted

A memory array comprising strings of memory cells comprises laterally-spaced memory blocks individually comprising a vertical stack comprising alternating insulative tiers and conductive tiers above a conductor tier. Strings of memory cells comprise channel-material strings that extend through the insulative tiers and the conductive tiers in the memory blocks. The channel-material strings directly electrically couple to conductor material of the conductor tier. Intervening material is laterally-between and longitudinally-along immediately-laterally-adjacent of the memory blocks. The intervening material comprises a laterally-outer insulative lining extending longitudinally-along the immediately-laterally-adjacent memory-blocks. The laterally-outer insulative lining has its lowest surface between a top and a bottom of the lowest conductive tier. The laterally-outer insulative lining has its highest surface at or below a lowest surface of the next-lowest conductive tier. Laterally-inner insulating material extends longitudinally-along the immediately-laterally-adjacent memory blocks laterally-inward of the laterally-outer insulative lining. An interface is between the laterally-outer insulative lining and the laterally-inner insulating material. Methods are also disclosed.