17940945. Weight Calibration Check for Integrated Circuit Devices having Analog Inference Capability simplified abstract (Micron Technology, Inc.)

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Weight Calibration Check for Integrated Circuit Devices having Analog Inference Capability

Organization Name

Micron Technology, Inc.

Inventor(s)

Poorna Kale of Folsom CA (US)

Weight Calibration Check for Integrated Circuit Devices having Analog Inference Capability - A simplified explanation of the abstract

This abstract first appeared for US patent application 17940945 titled 'Weight Calibration Check for Integrated Circuit Devices having Analog Inference Capability

Simplified Explanation

The abstract describes an integrated circuit device that checks the calibration of memory cells used for multiplication and accumulation operations. The device programs threshold voltages of memory cells to store weight data and results of operations, then compares the results to ensure calibration integrity.

  • The integrated circuit device has a mechanism to check calibration of memory cells for multiplication and accumulation operations.
  • The device programs threshold voltages of memory cells to store weight data and operation results.
  • During a calibration check, the device compares the stored results to ensure calibration integrity.

Potential Applications

This technology could be applied in various fields such as:

  • Signal processing
  • Image processing
  • Machine learning algorithms

Problems Solved

This technology helps in:

  • Ensuring accurate results in multiplication and accumulation operations
  • Detecting and correcting calibration errors in memory cells

Benefits

The benefits of this technology include:

  • Improved accuracy in mathematical operations
  • Enhanced reliability in memory cell calibration
  • Increased efficiency in integrated circuit devices

Potential Commercial Applications

Optimizing this technology for commercial use could lead to applications in:

  • Consumer electronics
  • Automotive systems
  • Industrial automation

Unanswered Questions

How does the device handle variations in input data during calibration checks?

The abstract does not specify how the device accounts for different input data scenarios during calibration checks.

What is the impact of calibration errors on the overall performance of the integrated circuit device?

The abstract does not elaborate on the potential consequences of calibration errors on the device's functionality and performance.


Original Abstract Submitted

An integrated circuit device having a mechanism to check calibration of memory cells configured to perform operations of multiplication and accumulation. The integrated circuit device programs, in a first mode, threshold voltages of first memory cells in a memory cell array to store weight data, and programs, in a second mode, threshold voltages of second memory cells in the memory cell array to store a first result of applying an operation of multiplication and accumulation to a sample input and the weight data. During a calibration check, the integrated circuit device performs the operation using the first memory cells to obtain a second result, and compares the first result, retrieved from the second memory cells, and the second result to determine whether calibration of output current characteristics of the first memory cells programmed in the first mode is corrupted.