17897153. APPARATUS WITH SIGNAL QUALITY FEEDBACK simplified abstract (Micron Technology, Inc.)
Contents
APPARATUS WITH SIGNAL QUALITY FEEDBACK
Organization Name
Inventor(s)
Jackson Callaghan of Boise ID (US)
APPARATUS WITH SIGNAL QUALITY FEEDBACK - A simplified explanation of the abstract
This abstract first appeared for US patent application 17897153 titled 'APPARATUS WITH SIGNAL QUALITY FEEDBACK
Simplified Explanation
- Explanation:**
The patent application relates to methods, apparatuses, and systems for measuring the quality of a signal received by a memory device and providing feedback. The memory device samples signal data using predetermined sequences of timing offsets or reference voltages relative to a reference signal, and provides feedback results to a controller regarding the quality of the sampled signal data.
- Potential Applications:**
- Memory testing and quality control in electronic devices - Signal processing and optimization in memory devices - Performance monitoring and improvement in memory systems
- Problems Solved:**
- Ensuring accurate and reliable signal reception in memory devices - Identifying and addressing signal quality issues promptly - Enhancing overall performance and efficiency of memory systems
- Benefits:**
- Improved signal quality and reliability in memory devices - Enhanced performance and functionality of memory systems - Real-time feedback for timely adjustments and optimizations
Original Abstract Submitted
Methods, apparatuses, and systems related to operations for measuring the quality of a signal received by a memory device and providing feedback. The memory device can sample signal data using a predetermined sequence of timing offsets relative to a reference signal. Additionally or alternatively, the memory device can sample the signal data using a predetermined sequence of reference voltages. The memory device can provide feedback results to a controller regarding the quality of the sampled signal data.
