17897053. COMMANDS FOR TESTING ERROR CORRECTION IN A MEMORY DEVICE simplified abstract (Micron Technology, Inc.)
Contents
COMMANDS FOR TESTING ERROR CORRECTION IN A MEMORY DEVICE
Organization Name
Inventor(s)
Francesco Lupo of München (DE)
COMMANDS FOR TESTING ERROR CORRECTION IN A MEMORY DEVICE - A simplified explanation of the abstract
This abstract first appeared for US patent application 17897053 titled 'COMMANDS FOR TESTING ERROR CORRECTION IN A MEMORY DEVICE
Simplified Explanation
- Explanation:**
The patent application describes systems, methods, and apparatus for error correction in memory devices. The memory device uses dedicated op-codes during programming to generate a pattern with known requested data errors. During reading operations, the ECC engine detects these calibrated errors as read errors, allowing observation of the ECC engine's behavior in a controlled environment.
- Potential Applications:**
- Memory devices in electronic devices - Data storage systems - Computer servers
- Problems Solved:**
- Improving error correction in memory devices - Enhancing data reliability and integrity - Providing a controlled environment for ECC engine testing
- Benefits:**
- Increased data accuracy - Enhanced memory device performance - Improved reliability of stored data
Original Abstract Submitted
Systems, methods, and apparatus related to error correction in memory devices. In one approach, a memory device uses dedicated op-codes to generate, during programming operations, a pattern including known requested data errors. During reading operations on the memory device, the calibrated errors will be detected by the ECC engine of the memory device as read errors. This permits a host device to observe, in a controlled environment, how the ECC engine behaves and performs in a final manufactured memory product.
