17893850. VOLTAGE FREQUENCY SCALING BASED ON ERROR RATE simplified abstract (Micron Technology, Inc.)

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VOLTAGE FREQUENCY SCALING BASED ON ERROR RATE

Organization Name

Micron Technology, Inc.

Inventor(s)

Leon Zlotnik of Camino CA (US)

VOLTAGE FREQUENCY SCALING BASED ON ERROR RATE - A simplified explanation of the abstract

This abstract first appeared for US patent application 17893850 titled 'VOLTAGE FREQUENCY SCALING BASED ON ERROR RATE

Simplified Explanation

The abstract describes a method for voltage frequency scaling based on error rate in a system on chip (SoC). The method involves monitoring the SoC at different voltage, frequency, and temperature values and collecting error rate data. This data is then entered into a database and used to generate a plot. Based on the plot and a specific error rate, a higher voltage value is determined.

  • Method for voltage frequency scaling based on error rate in a system on chip (SoC)
  • Monitoring operations performed at different voltage, frequency, and temperature values
  • Error rate data collected and entered into a database
  • Plot generated using the error rate data
  • Determination of a higher voltage value based on the plot and a specific error rate

Potential applications of this technology include:

  • Improving the performance and efficiency of systems on chips (SoCs)
  • Optimizing voltage frequency scaling for different applications and workloads
  • Enhancing the reliability and stability of SoCs by adjusting voltage values based on error rates
  • Enabling dynamic voltage scaling to adapt to changing conditions and requirements in real-time


Original Abstract Submitted

An example method for voltage frequency scaling based on error rate can include performing a plurality of monitoring operations on a system on chip (SoC) at a respective plurality of voltage values (and/or plurality of frequency values and/or temperature values). The example method can include causing error rate data gathered from each of the plurality of monitoring operations to be entered into a database, wherein the entered error rate data is associated with the plurality of voltage values. The entered data is associated with the respective plurality of voltage value. The example method can include generating a plot using the error rate date in the database. The example method can include determining a particular voltage value greater than each of the plurality of voltage values based on the plot and a particular error rate associated with the particular voltage value.

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