Wiz, Inc. (20240403426). TECHNIQUES FOR IMPROVED INSPECTION OF CONTAINER LAYERS

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TECHNIQUES FOR IMPROVED INSPECTION OF CONTAINER LAYERS

Organization Name

Wiz, Inc.

Inventor(s)

Yaniv Joseph Oliver of Tel Aviv (IL)

Ami Luttwak of Binyamina (IL)

Yinon Costica of Tel Aviv (IL)

Roy Reznik of Tel Aviv (IL)

Yaniv Shaked of Tel Aviv (IL)

Amir Lande Blau of Tel Aviv (IL)

TECHNIQUES FOR IMPROVED INSPECTION OF CONTAINER LAYERS

This abstract first appeared for US patent application 20240403426 titled 'TECHNIQUES FOR IMPROVED INSPECTION OF CONTAINER LAYERS



Original Abstract Submitted

a system and method for detecting a cybersecurity object in operating system-level virtualization objects. the method comprises: inspecting a first image of an operating system-level virtualization for a cybersecurity object; inspecting a second image for the cybersecurity object, wherein the second image is based off of the first image; associating the cybersecurity object with the first image, in response to detecting the cybersecurity object in the first image and detecting the cybersecurity object in the second image; and associating the cybersecurity object with the second image, in response to detecting the cybersecurity object in the second image and not detecting the cybersecurity object in the first image.