Texas instruments incorporated (20240337686). FORCE/MEASURE CURRENT GAIN TRIMMING simplified abstract
Contents
FORCE/MEASURE CURRENT GAIN TRIMMING
Organization Name
texas instruments incorporated
Inventor(s)
Tanmay Neema of Bangalore (IN)
Rajavelu Thinakaran of Bangalore (IN)
Gautam Nandi of Bangalore (IN)
FORCE/MEASURE CURRENT GAIN TRIMMING - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240337686 titled 'FORCE/MEASURE CURRENT GAIN TRIMMING
- Simplified Explanation:**
The patent application discusses techniques and circuits for error compensation in source measurement units (SMUs), which are devices capable of sourcing current to a device under test (DUT) and measuring current through the DUT. The application focuses on compensating for variations in the resistance of a sensing resistor in the SMU to improve the accuracy of current sourcing and measurement.
- Key Features and Innovation:**
- Solutions for error compensation in SMUs - Calibration of the gain of the current sensing amplifier to account for sensing resistor variance - Improved accuracy in current sourcing and measurement
- Potential Applications:**
- Testing and characterization of electronic components - Semiconductor device testing - Battery testing - Circuit design and validation
- Problems Solved:**
- Variations in sensing resistor resistance affecting current measurement accuracy - Ensuring precise current sourcing to DUTs - Improving overall measurement accuracy in SMUs
- Benefits:**
- Enhanced accuracy in current measurement - Reliable testing and characterization of electronic components - Improved performance in semiconductor device testing - Increased precision in battery testing
- Commercial Applications:**
Title: Error Compensation Techniques for Source Measurement Units in Electronic Testing This technology could be utilized in industries such as semiconductor manufacturing, electronics testing, battery research and development, and circuit design. Companies involved in these sectors could benefit from the improved accuracy and reliability offered by the error compensation techniques described in the patent application.
- Prior Art:**
Readers interested in exploring prior art related to error compensation in source measurement units may refer to research papers, patents, and industry publications on current sensing amplifiers, sensing resistor calibration, and error compensation techniques in electronic testing equipment.
- Frequently Updated Research:**
Researchers in the field of electronic testing and measurement may find relevant information on advancements in error compensation techniques, current sensing technology, and circuit design for source measurement units.
- Questions about Error Compensation Techniques for Source Measurement Units:**
1. How do error compensation techniques in source measurement units impact the accuracy of current measurement? 2. What are the potential challenges in implementing sensing resistor calibration for error compensation in SMUs?
Original Abstract Submitted
the techniques and circuits, described herein, include solutions for error compensation in source measurement units (smus). an example smu is capable of both sourcing current to a device under test (dut) and measuring current through the dut. an smu may include a sensing resistor coupled in series with the dut. a voltage across the sensing resistor may be measured by a current sensing amplifier in order to determine the output current through the dut. in practice, the resistance of the sensing resistor may vary depending on manufacturing tolerances, etc. a gain of the current sensing amplifier may be calibrated in order to compensate for sensing resistor variance, which increases the accuracy with which current to the dut can be sourced and measured.
