Taiwan semiconductor manufacturing company, ltd. (20240339344). SYSTEMS AND METHODS FOR INSPECTION STATIONS simplified abstract

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SYSTEMS AND METHODS FOR INSPECTION STATIONS

Organization Name

taiwan semiconductor manufacturing company, ltd.

Inventor(s)

Yan-Hong Liu of Zhudong Township (TW)

Chien-Chih Wu of Hsinchu City (TW)

Che-Fu Chen of Hsinchu City (TW)

SYSTEMS AND METHODS FOR INSPECTION STATIONS - A simplified explanation of the abstract

This abstract first appeared for US patent application 20240339344 titled 'SYSTEMS AND METHODS FOR INSPECTION STATIONS

The abstract of the patent application describes a workstation that includes a processing chamber for processing a workpiece, a load port for interfacing with the external environment, a robotic arm for transferring the workpiece between the load port and the processing chamber, and a defect sensor for detecting defects on the workpiece surface during transfer.

  • The workstation is designed to process workpieces efficiently and accurately.
  • The robotic arm enables seamless transfer of workpieces between the load port and the processing chamber.
  • The defect sensor ensures that any defects on the workpiece surface are detected and addressed promptly.
  • The combination of these features enhances the overall productivity and quality of the workstation.

Potential Applications: - Manufacturing processes requiring precise handling of workpieces - Quality control in production lines - Semiconductor fabrication

Problems Solved: - Ensures efficient and accurate processing of workpieces - Detects and addresses defects on workpiece surfaces - Improves overall productivity and quality control

Benefits: - Enhanced efficiency in processing workpieces - Improved quality control measures - Increased productivity in manufacturing processes

Commercial Applications: Title: "Advanced Workstation for Precision Workpiece Processing" This technology can be utilized in industries such as semiconductor manufacturing, automotive production, and electronics assembly. The precision handling and defect detection capabilities make it ideal for applications where quality control is crucial.

Prior Art: Readers can explore prior art related to robotic workstations, defect detection systems, and automated manufacturing processes to gain a deeper understanding of the technology's background and development.

Frequently Updated Research: Researchers are constantly exploring advancements in robotic automation, defect detection technologies, and manufacturing processes to further enhance the capabilities of workstations like the one described in the patent application.

Questions about Workstation Technology: 1. How does the defect sensor contribute to the overall efficiency of the workstation? The defect sensor plays a crucial role in ensuring that any defects on the workpiece surface are promptly detected and addressed, leading to improved quality control and productivity.

2. What are the key advantages of using a robotic arm in workpiece transfer within the workstation? The robotic arm enables seamless and precise transfer of workpieces between the load port and the processing chamber, enhancing the overall efficiency and accuracy of the workstation.


Original Abstract Submitted

a workstation includes: a processing chamber configured to process a workpiece; a load port configured to interface with an environment external to the workstation; a robotic arm configured to transfer the workpiece between the load port and the processing chamber; and a defect sensor configured to detect a defect along a surface of the workpiece when transferred between the load port and the processing chamber.

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