Sony group corporation (20240337584). PARTICLE ANALYSIS SYSTEM, PARTICLE ANALYSIS METHOD, AND FLOW CYTOMETER SYSTEM simplified abstract
Contents
PARTICLE ANALYSIS SYSTEM, PARTICLE ANALYSIS METHOD, AND FLOW CYTOMETER SYSTEM
Organization Name
Inventor(s)
YUSAKU Nakashima of TOKYO (JP)
PARTICLE ANALYSIS SYSTEM, PARTICLE ANALYSIS METHOD, AND FLOW CYTOMETER SYSTEM - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240337584 titled 'PARTICLE ANALYSIS SYSTEM, PARTICLE ANALYSIS METHOD, AND FLOW CYTOMETER SYSTEM
The patent application describes a particle analysis system that can detect luminance changes of light from particles in a container and measure the state of the container based on these events.
- The system includes an imaging unit for detecting luminance changes, a first scanning unit for scanning the focal position of the imaging unit in the depth direction of the container, and a processing unit for analyzing the data collected from the scanning process.
- By scanning multiple focal positions, the system can provide a comprehensive analysis of the particles in the container, allowing for efficient and accurate measurements.
- This innovation significantly shortens the operation time of particle analysis, making it more time-effective and precise.
- The system can be used in various industries such as pharmaceuticals, environmental monitoring, and materials science for analyzing particles in different types of containers.
- The benefits of this technology include improved accuracy, faster analysis, and increased efficiency in particle analysis processes.
- Commercial applications of this technology include quality control in manufacturing processes, research and development in various industries, and environmental monitoring for pollution control.
Questions about the technology:
1. How does the system detect luminance changes of light from particles in the container? 2. What are the potential limitations of using this system in different types of containers?
Original Abstract Submitted
an operation time is shortened. a particle analysis system according to an embodiment includes an imaging unit () configured to detect, as an event, a luminance change of light from a particle in a container, a first scanning unit () configured to scan a focal position of the imaging unit in a depth direction of the container, and a processing unit () configured to measure a state in the container based on the events detected at a plurality of the focal positions of the imaging unit by scanning of the first scanning unit.
