Snap inc. (20240192431). THIN FILM LAYERS HAVING NON-UNIFORM THICKNESSES simplified abstract

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THIN FILM LAYERS HAVING NON-UNIFORM THICKNESSES

Organization Name

snap inc.

Inventor(s)

Alexander Drayton of Abingdon (GB)

Marcell Kiss of Didcot (GB)

Parashara Panduranga of Banbury (GB)

Jamie Dean Reynolds of Abingdon (GB)

Cheng Shi of Didcot (GB)

THIN FILM LAYERS HAVING NON-UNIFORM THICKNESSES - A simplified explanation of the abstract

This abstract first appeared for US patent application 20240192431 titled 'THIN FILM LAYERS HAVING NON-UNIFORM THICKNESSES

Simplified Explanation: The patent application describes a method of creating diffractive elements with varying sizes on a thin film stack deposited on a substrate. This is achieved by forming patterns, etching holes of varying depths, and creating an imprint of the stack.

  • **Key Features and Innovation:**
   * Formation of non-uniform thickness layers on a thin film stack.
   * Etching holes of varying depths to create diffractive elements.
   * Imprinting the stack to form diffractive elements with varying sizes.

Potential Applications: The technology can be used in:

  • Optical devices
  • Holographic displays
  • Anti-counterfeiting measures

Problems Solved:

  • Creating diffractive elements with varying sizes efficiently
  • Enhancing optical effects in thin film stacks

Benefits:

  • Improved optical performance
  • Enhanced security features
  • Versatile applications in various industries

Commercial Applications:

  • "Innovative Method for Creating Diffractive Elements on Thin Film Stacks: Market Implications"

Prior Art: Research on diffractive elements in thin film stacks and related optical technologies.

Frequently Updated Research: Stay updated on advancements in diffractive element fabrication techniques and thin film stack technology.

Questions about Diffractive Elements on Thin Film Stacks: 1. How do diffractive elements enhance optical devices? 2. What are the potential security applications of diffractive elements in thin film stacks?


Original Abstract Submitted

in a thin film stack deposited on a substrate, a first layer can have a non-uniform thickness. a second layer, disposed so that the first layer is between the substrate and the second layer, can have a non-uniform thickness. a first pattern can be formed on the second layer to define first areas. the second layer can be etched in the first areas to form first holes having varying depths. a second pattern can be formed on the first layer in the first holes to define second areas. each second area can be smaller than a corresponding first area. the first layer can be etched in the second areas to form second holes having varying depths. an imprint of the etched thin film stack can be formed such that the first holes and the second holes form a plurality of diffractive elements having varying sizes on the imprint.