Sk hynix inc. (20240339167). STORAGE DEVICE, HOST DEVICE, AND METHOD OF OPERATING THE SAME simplified abstract
Contents
- 1 STORAGE DEVICE, HOST DEVICE, AND METHOD OF OPERATING THE SAME
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 STORAGE DEVICE, HOST DEVICE, AND METHOD OF OPERATING THE SAME - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Key Features and Innovation
- 1.6 Potential Applications
- 1.7 Problems Solved
- 1.8 Benefits
- 1.9 Commercial Applications
- 1.10 Questions about the Technology
- 1.11 Original Abstract Submitted
STORAGE DEVICE, HOST DEVICE, AND METHOD OF OPERATING THE SAME
Organization Name
Inventor(s)
Jeong Ho Jeon of Gyeonggi-do (KR)
STORAGE DEVICE, HOST DEVICE, AND METHOD OF OPERATING THE SAME - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240339167 titled 'STORAGE DEVICE, HOST DEVICE, AND METHOD OF OPERATING THE SAME
Simplified Explanation
The method involves testing specific areas in a storage device by generating and transmitting test requests.
- Determining areas to be tested in a storage device
- Generating test requests for the identified areas
- Transmitting the test requests to the storage device
Key Features and Innovation
- Targeted testing of specific areas in a storage device
- Efficient method for identifying and testing mapped and unmapped areas
- Streamlined process for generating and transmitting test requests
Potential Applications
This technology can be applied in various industries such as data storage, quality control, and system maintenance.
Problems Solved
- Ensures thorough testing of specific areas in a storage device
- Improves efficiency in identifying and testing different areas
- Streamlines the testing process for better performance
Benefits
- Enhanced accuracy in testing storage devices
- Time-saving method for testing mapped and unmapped areas
- Improved overall performance and reliability of storage devices
Commercial Applications
Title: Advanced Storage Device Testing Technology This technology can be utilized by storage device manufacturers, data centers, and IT departments for efficient testing and maintenance of storage devices, leading to improved performance and reliability.
Questions about the Technology
How does this method improve testing efficiency in storage devices?
This method allows for targeted testing of specific areas, reducing the time and resources required for comprehensive testing.
What industries can benefit from this technology?
Various industries such as data storage, quality control, and system maintenance can benefit from the improved testing efficiency offered by this technology.
Original Abstract Submitted
a method of operating a host device according to the present technology includes determining an area to be tested among a mapped area and an unmapped area included in a storage area of a storage device, generating a test request corresponding to the determined area, and transmitting the generated test request to the storage device.
