Semiconductor energy laboratory co., ltd. (20240258433). SEMICONDUCTOR DEVICE simplified abstract

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SEMICONDUCTOR DEVICE

Organization Name

semiconductor energy laboratory co., ltd.

Inventor(s)

Shunpei Yamazaki of Tokyo (JP)

SEMICONDUCTOR DEVICE - A simplified explanation of the abstract

This abstract first appeared for US patent application 20240258433 titled 'SEMICONDUCTOR DEVICE

Simplified Explanation:

This patent application describes a semiconductor device that can operate at high speeds or withstand stress effectively. The device includes a semiconductor film with a channel formation region and impurity regions, a gate electrode with an insulating film, and source and drain electrodes.

  • The semiconductor device can operate at high speeds.
  • The device has high strength against stress.
  • It includes a semiconductor film with a channel formation region and impurity regions.
  • A gate electrode overlaps the channel formation region with an insulating film.
  • Source and drain electrodes are in contact with the impurity regions.

Key Features and Innovation:

  • High-speed operation capability
  • High stress resistance
  • Efficient channel formation region design
  • Effective impurity region placement
  • Insulating film for gate electrode protection

Potential Applications:

This technology can be used in:

  • High-speed computing devices
  • Stress-resistant electronic components
  • Advanced semiconductor applications

Problems Solved:

  • Slow operation speeds in traditional semiconductor devices
  • Weakness against stress in conventional electronics

Benefits:

  • Improved performance in high-speed applications
  • Enhanced durability in stressful environments
  • Increased efficiency in semiconductor devices

Commercial Applications:

Potential commercial applications include:

  • High-performance computing systems
  • Aerospace and defense electronics
  • Industrial automation technologies

Prior Art:

Researchers can explore prior art related to semiconductor device design, gate electrode configurations, and impurity region optimization.

Frequently Updated Research:

Ongoing research may focus on enhancing the speed and stress resistance of semiconductor devices, improving gate electrode materials, and optimizing impurity region placement.

Questions about Semiconductor Devices:

1. What are the key factors influencing the speed of semiconductor devices? 2. How does the design of impurity regions impact the performance of semiconductor devices?


Original Abstract Submitted

a semiconductor device that can operate at high speed or having high strength against stress is provided. one embodiment of the present invention is a semiconductor device including a semiconductor film including a channel formation region and a pair of impurity regions between which the channel formation region is positioned; a gate electrode overlapping side and top portions of the channel formation region with an insulating film positioned between the gate electrode and the side and top portions; and a source electrode and a drain electrode in contact with side and top portions of the pair of impurity regions.