Samsung electronics co., ltd. (20240320804). NOISE FILTERING METHOD AND SCANNING ELECTRON MICROSCOPE (SEM) EQUIPMENT ALIGNMENT METHOD USING THE SAME simplified abstract
NOISE FILTERING METHOD AND SCANNING ELECTRON MICROSCOPE (SEM) EQUIPMENT ALIGNMENT METHOD USING THE SAME
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NOISE FILTERING METHOD AND SCANNING ELECTRON MICROSCOPE (SEM) EQUIPMENT ALIGNMENT METHOD USING THE SAME - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240320804 titled 'NOISE FILTERING METHOD AND SCANNING ELECTRON MICROSCOPE (SEM) EQUIPMENT ALIGNMENT METHOD USING THE SAME
The abstract of a patent application describes a noise filtering method for scanning electron microscope (SEM) images. This method involves converting the SEM image into a converted design image using a conversion model, then converting the converted design image into a gray level co-occurrence matrix (GLCM). Statistical characteristics of the GLCM are extracted to determine if the converted design image contains noise.
- Conversion of SEM image into converted design image using a conversion model
- Conversion of converted design image into a gray level co-occurrence matrix (GLCM)
- Extraction of statistical characteristics from the GLCM
- Determination of noise presence in the converted design image based on statistical characteristics
Potential Applications: - Image processing in scanning electron microscopy - Noise reduction in SEM images - Quality control in SEM imaging
Problems Solved: - Noise interference in SEM images - Improving image quality in SEM - Enhancing accuracy of SEM analysis
Benefits: - Improved image clarity - Enhanced accuracy of SEM data - Streamlined image processing in SEM
Commercial Applications: Title: Noise Filtering Technology for Scanning Electron Microscopy This technology can be used in semiconductor manufacturing, materials science research, and biological imaging industries. It can improve the quality and accuracy of SEM images, leading to better analysis and decision-making processes.
Questions about Noise Filtering Technology for Scanning Electron Microscopy: 1. How does the noise filtering method impact the overall quality of SEM images? 2. What are the potential limitations of this noise filtering technology in SEM applications?
Frequently Updated Research: Researchers are continuously exploring new algorithms and techniques to enhance noise filtering in SEM images. Stay updated on the latest advancements in this field to improve image quality and analysis accuracy.
Original Abstract Submitted
a noise filtering method includes converting a scanning electron microscope (sem) image into a converted design image using a conversion model, converting the converted design image into a gray level co-occurrence matrix (glcm), extracting statistical characteristics of the glcm, and determining whether the converted design image includes noise or not based on the statistical characteristics.
