Samsung electronics co., ltd. (20240211736). METHOD AND APPARATUS FOR INFERRING SEMICONDUCTOR MEASUREMENT RESULTS BASED ON ARTIFICIAL INTELLIGENCE simplified abstract
METHOD AND APPARATUS FOR INFERRING SEMICONDUCTOR MEASUREMENT RESULTS BASED ON ARTIFICIAL INTELLIGENCE
Organization Name
Inventor(s)
Seongryeol Kim of Suwon-si (KR)
METHOD AND APPARATUS FOR INFERRING SEMICONDUCTOR MEASUREMENT RESULTS BASED ON ARTIFICIAL INTELLIGENCE - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240211736 titled 'METHOD AND APPARATUS FOR INFERRING SEMICONDUCTOR MEASUREMENT RESULTS BASED ON ARTIFICIAL INTELLIGENCE
The patent application describes an apparatus and method for inferring semiconductor measurement results using artificial intelligence techniques. This involves receiving layout data of a semiconductor, generating partial layouts, selecting a representative partial layout, and predicting measurement results using a machine learning model.
- Utilizes artificial intelligence techniques for inferring semiconductor measurement results
- Receives layout data and generates partial layouts for analysis
- Selects a representative partial layout for prediction
- Predicts measurement results using a machine learning model
- Improves accuracy and efficiency of semiconductor measurements
Potential Applications: - Semiconductor manufacturing industry - Quality control processes - Research and development in semiconductor technology
Problems Solved: - Enhances accuracy of semiconductor measurement results - Streamlines the process of analyzing semiconductor layouts - Reduces human error in predicting measurement outcomes
Benefits: - Increased efficiency in semiconductor analysis - Improved quality control in manufacturing processes - Enhanced predictive capabilities for semiconductor measurements
Commercial Applications: Title: "AI-Driven Semiconductor Measurement Inference Technology" This technology can be applied in semiconductor manufacturing companies to optimize production processes, improve product quality, and reduce costs. It can also be utilized in research institutions for advanced semiconductor analysis and development.
Questions about AI: 1. How does artificial intelligence improve the accuracy of semiconductor measurement results? Artificial intelligence algorithms can analyze large amounts of data quickly and identify patterns that may not be apparent to human analysts, leading to more accurate predictions.
2. What are the potential limitations of using machine learning models for semiconductor measurement inference? Machine learning models require large amounts of training data and may not always generalize well to new semiconductor layouts, leading to potential inaccuracies in predictions.
Original Abstract Submitted
provided are an apparatus and a method of inferring semiconductor measurement results. the method of inferring semiconductor measurement results is based on artificial intelligence techniques and includes receiving layout data representing a layout of a semiconductor, generating a plurality of partial layouts based on the layout data, selecting a representative partial layout among the plurality of partial layouts, and generating, using a machine learning model, a predicted measurement result for the semiconductor based on the representative partial layout.
