Samsung electronics co., ltd. (20240193339). METHOD OF ANALYZING ELECTROSTATIC DISCHARGE NETWORK USING COMMON RESISTANCE REMOVAL, SYSTEM PERFORMING THE SAME AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME simplified abstract
METHOD OF ANALYZING ELECTROSTATIC DISCHARGE NETWORK USING COMMON RESISTANCE REMOVAL, SYSTEM PERFORMING THE SAME AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME
Organization Name
Inventor(s)
Jordan Timothy Davis of Suwon-si (KR)
METHOD OF ANALYZING ELECTROSTATIC DISCHARGE NETWORK USING COMMON RESISTANCE REMOVAL, SYSTEM PERFORMING THE SAME AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240193339 titled 'METHOD OF ANALYZING ELECTROSTATIC DISCHARGE NETWORK USING COMMON RESISTANCE REMOVAL, SYSTEM PERFORMING THE SAME AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME
The abstract of the patent application describes a method for analyzing an electrostatic discharge (ESD) network in a semiconductor device by calculating the common resistance of the ESD protection circuit and performing a network analysis.
- Calculation of common resistance based on input data and predetermined equations
- Utilization of resistances associated with the I/O pad, ESD protection circuit, and functional circuit
- Exclusion of common resistance in network analysis of the semiconductor device
Potential Applications: - Semiconductor industry for ESD protection - Electronic device manufacturing
Problems Solved: - Efficient analysis of ESD networks - Improved understanding of semiconductor device behavior
Benefits: - Enhanced ESD protection - Optimal performance of semiconductor devices
Commercial Applications: Title: "Advanced ESD Protection Analysis for Semiconductor Devices" Description: This technology can be utilized by semiconductor companies to enhance the reliability and performance of their electronic devices, leading to improved customer satisfaction and market competitiveness.
Prior Art: Research on ESD protection circuits and network analysis in semiconductor devices can provide valuable insights into existing technologies in this field.
Frequently Updated Research: Ongoing research in semiconductor device design and ESD protection techniques can contribute to the advancement of this technology.
Questions about ESD Protection Analysis: 1. How does the calculation of common resistance impact the overall performance of the semiconductor device? 2. What are the key factors to consider in optimizing ESD protection circuits for different types of semiconductor devices?
Original Abstract Submitted
in an example method of analyzing an electrostatic discharge (esd) network, input data characterizing a semiconductor device is received. the semiconductor device includes an input/output (i/o) pad, an esd protection circuit, and at least one functional circuit. a common resistance of the esd protection circuit is calculated based on the input data and using a plurality of resistances and at least one predetermined equation. the plurality of resistances are associated with the i/o pad, the esd protection circuit, and the at least one functional circuit. a network analysis is performed on the semiconductor device by excluding the common resistance.
