Samsung display co., ltd. (20240192142). INSPECTION APPARATUS AND METHOD simplified abstract
Contents
- 1 INSPECTION APPARATUS AND METHOD
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 INSPECTION APPARATUS AND METHOD - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Key Features and Innovation
- 1.6 Potential Applications
- 1.7 Problems Solved
- 1.8 Benefits
- 1.9 Commercial Applications
- 1.10 Prior Art
- 1.11 Frequently Updated Research
- 1.12 Questions about Inspection Technology
- 1.13 Original Abstract Submitted
INSPECTION APPARATUS AND METHOD
Organization Name
Inventor(s)
TAE-JIN Hwang of Yongin-si (KR)
SE-KWANG Han of Yongin-si (KR)
SEONGHYEON Cheon of Yongin-si (KR)
INSPECTION APPARATUS AND METHOD - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240192142 titled 'INSPECTION APPARATUS AND METHOD
Simplified Explanation
The patent application describes inspection apparatuses and methods involving a light source, an inspection module, and a separator to examine objects with different parts.
- The inspection apparatus includes a light source that emits a beam towards an inspection object with distinct parts.
- An inspection module receives the beam after it interacts with the object, allowing for analysis.
- A separator, positioned between the object and the module, guides the beam and ensures accurate inspection.
Key Features and Innovation
- Utilization of a light source to illuminate and inspect objects with varying components.
- Integration of an inspection module to capture and analyze the altered beam after interaction with the object.
- Inclusion of a separator to guide the beam and maintain precision during inspection.
Potential Applications
The technology can be applied in industries such as manufacturing, quality control, and material analysis for precise inspection of complex objects.
Problems Solved
The technology addresses the challenge of inspecting objects with multiple parts accurately and efficiently.
Benefits
- Enhanced inspection accuracy for objects with diverse components.
- Improved quality control processes in various industries.
- Increased efficiency in material analysis and defect detection.
Commercial Applications
- "Advanced Inspection Technology for Manufacturing and Quality Control"
- Potential use in automotive, aerospace, and electronics industries for component inspection and defect detection.
Prior Art
Further research can be conducted in the field of optical inspection systems and technologies for related prior art.
Frequently Updated Research
Stay updated on advancements in optical inspection systems, material analysis techniques, and quality control methodologies for relevant research.
Questions about Inspection Technology
How does the inspection apparatus improve accuracy in examining objects with different parts?
The inspection apparatus utilizes a light source, inspection module, and separator to ensure precise analysis of objects with distinct components, enhancing accuracy in inspection processes.
What are the potential commercial applications of this inspection technology?
The technology can be applied in various industries such as manufacturing, quality control, and material analysis for efficient and accurate inspection of complex objects, leading to improved processes and product quality.
Original Abstract Submitted
disclosed are inspection apparatuses and methods. the inspection apparatus includes a light source configured to irradiate a beam to an inspection object including a first part and a second part different from the first part; an inspection module spaced apart from the inspection object and onto which a beam, whose path is changed after being irradiated to the inspection object, is incident; and a separator between the inspection object and the inspection module and through which at least a portion of the beam, whose path is changed, passes. the separator includes: a frame in which an opening is defined, and a separation member in the opening and configured to change a path of a beam, which passes through the separator.
