Qualcomm incorporated (20240321370). SECURE ANTI-FUSE ONE TIME PROGRAMMABLE BIT CELL DESIGN simplified abstract

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SECURE ANTI-FUSE ONE TIME PROGRAMMABLE BIT CELL DESIGN

Organization Name

qualcomm incorporated

Inventor(s)

Abhijeet Paul of Escondido CA (US)

Mishel Matloubian of San Diego CA (US)

SECURE ANTI-FUSE ONE TIME PROGRAMMABLE BIT CELL DESIGN - A simplified explanation of the abstract

This abstract first appeared for US patent application 20240321370 titled 'SECURE ANTI-FUSE ONE TIME PROGRAMMABLE BIT CELL DESIGN

The patent application describes secure anti-fuse one-time programmable (OTP) bit cells, which are used in electronic devices for storing data securely.

  • The OTP bit cell consists of a P− well with an N+ region and a P+ region, along with first and second contacts connected to the N+ and P+ regions respectively.
  • An insulating layer covers parts of the N+ region, P− well, and P+ region, with a gate structure placed on top and a third contact connected to it.
  • In the unprogrammed mode, the insulating layer creates high resistance between the third contact and the second contact, while in the programmed mode, a rupture in the insulating layer creates low resistance between them.

Potential Applications: - Secure data storage in electronic devices - Authentication systems - Secure key storage

Problems Solved: - Preventing unauthorized access to stored data - Ensuring data security in electronic devices

Benefits: - Enhanced security for sensitive data - Reliable one-time programmable technology - Protection against data breaches

Commercial Applications: Secure data storage solutions for industries such as banking, healthcare, and government agencies, where data security is crucial.

Questions about Secure Anti-Fuse OTP Bit Cells: 1. How do secure anti-fuse OTP bit cells differ from traditional programmable memory technologies?

  - Secure anti-fuse OTP bit cells offer one-time programmability and enhanced security features compared to traditional programmable memory technologies.

2. What are the potential challenges in implementing secure anti-fuse OTP bit cells in large-scale electronic devices?

  - The challenges may include scalability, manufacturing costs, and integration with existing systems.


Original Abstract Submitted

disclosed are secure anti-fuse one-time programmable (otp) bit cells. in an aspect, an otp bit cell includes a p− well comprising an n+ region and a p+ region, a first contact electrically coupled to the n+ region of the p− well, a second contact electrically coupled to the p+ region of the p− well, an insulating layer disposed over a portion of the n+ region, a portion of the p− well, and a portion of the p+ region, a gate structure disposed over the insulating layer, and a third contact electrically coupled to the gate structure. in an unprogrammed mode, the insulating layer creates a high resistance between the third contact and the second contact, and in a programmed mode, a rupture in the insulating layer creates a low resistance between the third contact and the second contact.