Nvidia corporation (20240289239). ONLINE FAULT DETECTION IN RERAM-BASED AI/ML simplified abstract

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ONLINE FAULT DETECTION IN RERAM-BASED AI/ML

Organization Name

nvidia corporation

Inventor(s)

Krishnendu Chakrabarty of Chapel Hill NC (US)

Mengyun Liu of Santa Clara CA (US)

ONLINE FAULT DETECTION IN RERAM-BASED AI/ML - A simplified explanation of the abstract

This abstract first appeared for US patent application 20240289239 titled 'ONLINE FAULT DETECTION IN RERAM-BASED AI/ML

Simplified Explanation

The patent application describes a method for monitoring the power consumption of ReRAM crossbars to detect faults using statistical features and machine learning techniques.

  • Statistical features are computed before and after a changepoint in the power consumption time series.
  • A predictive model is trained to estimate fault rates and reduce test time.
  • The method aims to ensure high classification accuracy for AI/ML datasets in a ReRAM-based computing system.

Key Features and Innovation

  • Monitoring dynamic power consumption of ReRAM crossbars.
  • Detecting faults using statistical features and machine learning.
  • Training a predictive model to estimate fault rates.
  • Reducing test time while maintaining high classification accuracy.
  • Ensuring efficient fault localization and error recovery.

Potential Applications

The technology can be applied in various fields such as:

  • AI/ML systems
  • IoT devices
  • Embedded systems
  • Data centers

Problems Solved

  • Efficient fault detection in ReRAM crossbars.
  • Reduction of test time in fault localization.
  • Improved accuracy in fault classification.

Benefits

  • Faster fault detection and recovery.
  • Enhanced system reliability.
  • Cost-effective maintenance.

Commercial Applications

  • The technology can be utilized in AI/ML systems, IoT devices, and data centers to improve fault detection and system reliability, potentially reducing maintenance costs and downtime.

Prior Art

Readers can explore prior research on ReRAM technology, fault detection methods, and machine learning applications in computing systems to understand the background of this innovation.

Frequently Updated Research

Stay updated on advancements in ReRAM technology, fault detection algorithms, and machine learning techniques to enhance the efficiency and accuracy of fault detection systems.

Questions about ReRAM Fault Detection

How does the method of monitoring power consumption in ReRAM crossbars differ from traditional fault detection techniques?

The method combines statistical features and machine learning to detect faults based on changepoints in power consumption, allowing for more efficient fault localization and error recovery.

What are the potential implications of using predictive models in fault detection for ReRAM-based computing systems?

Predictive models can significantly reduce test time and improve fault detection accuracy, leading to enhanced system reliability and performance.


Original Abstract Submitted

the disclosure describes a method of monitoring the dynamic power consumption of reram crossbars and determines the occurrence of faults when a changepoint is detected in the monitored power-consumption time series. statistical features are computed before and after the changepoint and train a predictive model using machine-learning techniques. in this way, the computationally expensive fault localization and error-recovery steps are carried out only when a high fault rate is estimated. with the proposed fault-detection method and the predictive model, the test time is significantly reduced while high classification accuracy for well-known ai/ml datasets using a reram-based computing system (rcs) can still be ensured.