Nvidia corporation (20240161800). PHYSICALLY UNCLONABLE CELL USING DUAL-INTERLOCKING AND ERROR CORRECTION TECHNIQUES simplified abstract
Contents
- 1 PHYSICALLY UNCLONABLE CELL USING DUAL-INTERLOCKING AND ERROR CORRECTION TECHNIQUES
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 PHYSICALLY UNCLONABLE CELL USING DUAL-INTERLOCKING AND ERROR CORRECTION TECHNIQUES - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Unanswered Questions
- 1.11 Original Abstract Submitted
PHYSICALLY UNCLONABLE CELL USING DUAL-INTERLOCKING AND ERROR CORRECTION TECHNIQUES
Organization Name
Inventor(s)
Mahmut Ersin Sinangil of Los Altos CA (US)
Sudhir Shrikantha Kudva of Dublin CA (US)
Nikola Nedovic of San Jose CA (US)
Carl Thomas Gray of Apex NC (US)
PHYSICALLY UNCLONABLE CELL USING DUAL-INTERLOCKING AND ERROR CORRECTION TECHNIQUES - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240161800 titled 'PHYSICALLY UNCLONABLE CELL USING DUAL-INTERLOCKING AND ERROR CORRECTION TECHNIQUES
Simplified Explanation
The patent application abstract describes a PUF cell utilizing a dual-interlocking scheme to improve noise immunity and stability across different voltage and temperature conditions in noisy environments. This PUF cell can be used in conjunction with error detection techniques to filter out unstable cells and generate a device-specific bit pattern, such as a master key.
- Improved noise immunity and stability with dual-interlocking scheme
- Suitable for different voltage and temperature conditions
- Can be used with error detection techniques
- Generates device-specific bit patterns
Potential Applications
The technology can be applied in secure authentication systems, cryptographic key generation, secure communication protocols, and anti-counterfeiting measures.
Problems Solved
The technology addresses the challenges of noise interference, instability, and security vulnerabilities in device authentication and cryptographic key generation.
Benefits
The benefits of this technology include enhanced security, improved reliability, and increased resistance to environmental variations.
Potential Commercial Applications
Potential commercial applications include IoT devices, smart cards, secure storage systems, and secure communication networks.
Possible Prior Art
One possible prior art is the use of error detection techniques in PUF cells to improve stability and reliability.
Unanswered Questions
1. How does the dual-interlocking scheme in the PUF cell enhance noise immunity compared to traditional PUF designs? 2. What specific error detection techniques are most effective in combination with the dual-interlocking scheme for screening out unstable cells in the PUF array?
Original Abstract Submitted
puf cells utilizing a dual-interlocking scheme demonstrating improved noise immunity and stability across different v/t conditions and different uses over time in noisy environments. the puf cell may be advantageously utilized in conjunction with error detection techniques that screen out unstable cells. a set of such puf cells utilized to generate a device-specific bit pattern, for example a master key.
