NATIONAL INSTITUTE OF METROLOGY, CHINA Patent Application Trends in 2024

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Contents

1 NATIONAL INSTITUTE OF METROLOGY, CHINA Patent Filing Activity
2 NATIONAL INSTITUTE OF METROLOGY, CHINA patent applications in 2024
3 Top 10 Technology Areas
4 Emerging Technology Areas
5 Top Inventors
6 Patent Categories
7 Geographical Distribution of Inventors
8 Geographical Distribution of US Inventors

NATIONAL INSTITUTE OF METROLOGY, CHINA Patent Filing Activity

NATIONAL INSTITUTE OF METROLOGY, CHINA patent applications in 2024

Top 10 Technology Areas

C07K14/165 (No explanation available)
- Count: 1 patents
- Example: 20240199707. METHOD FOR PREPARING AND CERTIFYING NOVEL CORONAVIRUS NUCLEOCAPSID PROTEIN simplified abstract (NATIONAL INSTITUTE OF METROLOGY, CHINA)
C07K1/18 (No explanation available)
- Count: 1 patents
- Example: 20240199707. METHOD FOR PREPARING AND CERTIFYING NOVEL CORONAVIRUS NUCLEOCAPSID PROTEIN simplified abstract (NATIONAL INSTITUTE OF METROLOGY, CHINA)
C07K1/28 (No explanation available)
- Count: 1 patents
- Example: 20240199707. METHOD FOR PREPARING AND CERTIFYING NOVEL CORONAVIRUS NUCLEOCAPSID PROTEIN simplified abstract (NATIONAL INSTITUTE OF METROLOGY, CHINA)
C07K1/36 (No explanation available)
- Count: 1 patents
- Example: 20240199707. METHOD FOR PREPARING AND CERTIFYING NOVEL CORONAVIRUS NUCLEOCAPSID PROTEIN simplified abstract (NATIONAL INSTITUTE OF METROLOGY, CHINA)
G01J5/601 (No explanation available)
- Count: 1 patents
- Example: 20240133749. BRDF MEASUREMENT SYSTEM AND METHOD, ELECTRONIC DEVICE, AND STORAGE MEDIUM simplified abstract (National Institute of Metrology, China)
G01J5/0205 (No explanation available)
- Count: 1 patents
- Example: 20240133749. BRDF MEASUREMENT SYSTEM AND METHOD, ELECTRONIC DEVICE, AND STORAGE MEDIUM simplified abstract (National Institute of Metrology, China)
G01J5/027 (No explanation available)
- Count: 1 patents
- Example: 20240133749. BRDF MEASUREMENT SYSTEM AND METHOD, ELECTRONIC DEVICE, AND STORAGE MEDIUM simplified abstract (National Institute of Metrology, China)
G01J5/0887 (No explanation available)
- Count: 1 patents
- Example: 20240133749. BRDF MEASUREMENT SYSTEM AND METHOD, ELECTRONIC DEVICE, AND STORAGE MEDIUM simplified abstract (National Institute of Metrology, China)
G01J2003/425 (No explanation available)
- Count: 1 patents
- Example: 20240133749. BRDF MEASUREMENT SYSTEM AND METHOD, ELECTRONIC DEVICE, AND STORAGE MEDIUM simplified abstract (National Institute of Metrology, China)
G01S19/235 (No explanation available)
- Count: 1 patents
- Example: 20240142634. TRUSTED SPACE POSITIONING CALIBRATION SERVICE SYSTEM AND OPERATION METHOD THEREOF simplified abstract (National Institute of Metrology, China)

Emerging Technology Areas

G01R15/04 (No explanation available)
- Count: 1 patents
- Example: 20240151757. METHOD FOR ACHIEVING TERMINAL-PAIR DEFINITION OF FOUR-TERMINAL-PAIR IMPEDANCE AND APPLICATION THEREOF simplified abstract (National Institute of Metrology, China)
G01R27/08 (No explanation available)
- Count: 1 patents
- Example: 20240151757. METHOD FOR ACHIEVING TERMINAL-PAIR DEFINITION OF FOUR-TERMINAL-PAIR IMPEDANCE AND APPLICATION THEREOF simplified abstract (National Institute of Metrology, China)
G01P15/0915 (No explanation available)
- Count: 1 patents
- Example: 20240069063. ON-SITE RECIPROCITY CALIBRATION METHOD FOR PIEZOELECTRIC ACCELEROMETER simplified abstract (National Institute of Metrology, China)
G01P21/00 (No explanation available)
- Count: 1 patents
- Example: 20240069063. ON-SITE RECIPROCITY CALIBRATION METHOD FOR PIEZOELECTRIC ACCELEROMETER simplified abstract (National Institute of Metrology, China)
G01S19/43 (No explanation available)
- Count: 1 patents
- Example: 20240142634. TRUSTED SPACE POSITIONING CALIBRATION SERVICE SYSTEM AND OPERATION METHOD THEREOF simplified abstract (National Institute of Metrology, China)
G01S19/235 (No explanation available)
- Count: 1 patents
- Example: 20240142634. TRUSTED SPACE POSITIONING CALIBRATION SERVICE SYSTEM AND OPERATION METHOD THEREOF simplified abstract (National Institute of Metrology, China)
G01J2003/425 (No explanation available)
- Count: 1 patents
- Example: 20240133749. BRDF MEASUREMENT SYSTEM AND METHOD, ELECTRONIC DEVICE, AND STORAGE MEDIUM simplified abstract (National Institute of Metrology, China)
G01J5/0887 (No explanation available)
- Count: 1 patents
- Example: 20240133749. BRDF MEASUREMENT SYSTEM AND METHOD, ELECTRONIC DEVICE, AND STORAGE MEDIUM simplified abstract (National Institute of Metrology, China)
G01J5/027 (No explanation available)
- Count: 1 patents
- Example: 20240133749. BRDF MEASUREMENT SYSTEM AND METHOD, ELECTRONIC DEVICE, AND STORAGE MEDIUM simplified abstract (National Institute of Metrology, China)
G01J5/0205 (No explanation available)
- Count: 1 patents
- Example: 20240133749. BRDF MEASUREMENT SYSTEM AND METHOD, ELECTRONIC DEVICE, AND STORAGE MEDIUM simplified abstract (National Institute of Metrology, China)

Top Inventors

Liqing WU (1 patent)
Xinhua DAI (1 patent)
Wei MI (1 patent)
Yahui LIU (1 patent)
Tao PENG (1 patent)
Jie XIE (1 patent)
Zhifeng WU (1 patent)
Caihong DAI (1 patent)
Ling LI (1 patent)
Yanfei WANG (1 patent)

Patent Categories

Geographical Distribution of Inventors

Geographical Distribution of US Inventors

NATIONAL INSTITUTE OF METROLOGY, CHINA Inventor States 2024 - Up to June 2024

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