Micron technology, inc. (20250094063). CHARGE LOSS MITIGATION THROUGH DYNAMIC PROGRAMMING SEQUENCE
CHARGE LOSS MITIGATION THROUGH DYNAMIC PROGRAMMING SEQUENCE
Organization Name
Inventor(s)
Yu-Chung Lien of San Jose CA US
Zhenming Zhou of San Jose CA US
CHARGE LOSS MITIGATION THROUGH DYNAMIC PROGRAMMING SEQUENCE
This abstract first appeared for US patent application 20250094063 titled 'CHARGE LOSS MITIGATION THROUGH DYNAMIC PROGRAMMING SEQUENCE
Original Abstract Submitted
a program command specifying new data to be programmed is received and partitioned into a plurality of data partitions. a wordline addressing a first set of memory cells to be programmed with a data partition of the plurality of data partitions is identified for a specified block of the memory device. existing data stored by a second set of memory cells is read. an expected data state metrics is produced for each data partition of the plurality of data partitions. a data partition associated with a lowest expected data state metric among the plurality of expected data state metrics is identified. the identified data partition is programmed to the identified wordline.