Micron technology, inc. (20250085767). METHODS AND APPARATUS FOR CHARACTERIZING MEMORY DEVICES
Contents
METHODS AND APPARATUS FOR CHARACTERIZING MEMORY DEVICES
Organization Name
Inventor(s)
Jonathan D. Harms of Boise ID (US)
METHODS AND APPARATUS FOR CHARACTERIZING MEMORY DEVICES
This abstract first appeared for US patent application 20250085767 titled 'METHODS AND APPARATUS FOR CHARACTERIZING MEMORY DEVICES
Original Abstract Submitted
methods and apparatus for using characterized devices such as memories. in one embodiment, characterized memories are associated with a range of performances over a range of operational parameters. the characterized memories can be used in conjunction with a solution density function to optimize memory searching. in one exemplary embodiment, a cryptocurrency miner can utilize characterized memories to generate memory hard proof-of-work (pow). the results may be further validated against general compute memories; such that only valid solutions are broadcasted to the mining community. in one embodiment, the validation mechanism is implemented for a plurality of searching apparatus in parallel to provide a more distributed and efficient approach. various other applications for characterized memories are also described in greater detail herein (e.g., blockchain, social media, machine learning, probabilistic applications and other error-tolerant applications).
