Micron technology, inc. (20250013374). READ PERFORMANCE TECHNIQUES FOR TIME RETENTION
Contents
READ PERFORMANCE TECHNIQUES FOR TIME RETENTION
Organization Name
Inventor(s)
READ PERFORMANCE TECHNIQUES FOR TIME RETENTION
This abstract first appeared for US patent application 20250013374 titled 'READ PERFORMANCE TECHNIQUES FOR TIME RETENTION
Original Abstract Submitted
methods, systems, and devices for read performance techniques for time retention are described. a memory system may store data in a block of memory cells and perform a power cycle operation. based on performing the power cycle operation, the memory system may determine a first voltage offset associated with the block of memory cells by executing a first read command using an auto-read calibration operation. based on the first voltage offset, and, in some examples, one or more additional voltage offsets, the memory system may calculate a retention time of data stored in the block of memory cells. the memory system may adjust a read voltage based on the retention time and perform one or more additional read commands.
