Micron technology, inc. (20240338139). WORDLINE LEAKAGE TEST MANAGEMENT simplified abstract
Contents
WORDLINE LEAKAGE TEST MANAGEMENT
Organization Name
Inventor(s)
Wai Leong Chin of Singapore (SG)
Francis Chee Khai Chew of Singapore (SG)
Trismardawi Tanadi of Folsom CA (US)
Chun Sum Yeung of San Jose CA (US)
Lawrence Dumalag of Folsom CA (US)
Ekamdeep Singh of San Jose CA (US)
WORDLINE LEAKAGE TEST MANAGEMENT - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240338139 titled 'WORDLINE LEAKAGE TEST MANAGEMENT
The abstract describes a memory sub-system that conducts a series of wordline leakage tests in response to the temperature of the memory block being within a specific range. If the results of these tests meet certain conditions, an action is taken.
- Memory sub-system conducts wordline leakage tests based on temperature
- Results of tests determine if action should be taken
- Conditions must be met for action to be executed
Potential Applications: - Memory systems in electronic devices - Temperature-sensitive memory management systems
Problems Solved: - Ensuring memory block stability under varying temperatures - Preventing memory leakage issues due to temperature fluctuations
Benefits: - Improved memory system reliability - Enhanced performance under different temperature conditions
Commercial Applications: Title: "Temperature-Responsive Memory Sub-System for Enhanced Reliability" This technology can be utilized in various electronic devices such as smartphones, tablets, and computers to optimize memory performance and stability under changing temperature environments. This can lead to increased customer satisfaction and brand loyalty for manufacturers.
Prior Art: Researchers can explore existing patents related to memory management systems and temperature-sensitive technologies to understand the evolution of similar concepts in the field.
Frequently Updated Research: Researchers in the field of semiconductor technology and memory systems may be conducting studies on optimizing memory performance under varying environmental conditions. Stay updated on relevant conferences and publications for the latest advancements in this area.
Questions about Memory Sub-System: 1. How does the memory sub-system determine the threshold temperature range for conducting the wordline leakage tests? The threshold temperature range is likely pre-defined based on the specifications of the memory block and the expected operating conditions.
2. What types of actions can be executed by the memory sub-system based on the results of the wordline leakage tests? The actions could include adjusting memory settings, activating cooling mechanisms, or alerting the system to potential issues.
Original Abstract Submitted
a memory sub-system causing execution of a first wordline leakage test of a first wordline group of a set of wordline groups of a memory block in response to determining a temperature of the memory block is within a threshold temperature range. a first result of the first wordline leakage test is determined. a second wordline leakage test of a second wordline group is caused to be executed and a second result is determined. a determination is made that the first result of the first wordline leakage test of the first wordline group satisfies a first condition. a determination is made that the second result of the second wordline leakage test of the second wordline group satisfies a second condition. in response to satisfaction of the conditions, an action is executed.
