Micron technology, inc. (20240292607). SELF-ALIGNED LINE CONTACTS simplified abstract

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SELF-ALIGNED LINE CONTACTS

Organization Name

micron technology, inc.

Inventor(s)

Jun Ho Lee of Higashihiroshima City (JP)

Byung Yoon Kim of Boise ID (US)

Sangmin Hwang of San Jose CA (US)

SELF-ALIGNED LINE CONTACTS - A simplified explanation of the abstract

This abstract first appeared for US patent application 20240292607 titled 'SELF-ALIGNED LINE CONTACTS

Simplified Explanation: The patent application describes an apparatus with line contacts for conductive signal lines, ensuring a margin for shorts between signal lines even with misalignment. It also details a two-stage removal process for forming a memory device.

Key Features and Innovation:

  • Apparatus with line contacts for conductive signal lines
  • Margin for shorts between signal lines maintained even with misalignment
  • Two-stage removal process for forming a memory device

Potential Applications: This technology can be applied in memory devices, semiconductor manufacturing, and integrated circuits where precise alignment of signal lines is crucial.

Problems Solved: The technology addresses the challenge of maintaining a margin for shorts between closely-spaced signal lines, even in cases of misalignment during manufacturing processes.

Benefits:

  • Improved reliability in memory devices
  • Enhanced manufacturing efficiency
  • Reduced risk of short circuits in integrated circuits

Commercial Applications: The technology could be utilized in the production of memory devices, semiconductor components, and other electronic devices requiring precise alignment of signal lines.

Prior Art: Readers can explore prior art related to line contact formation in memory devices, semiconductor manufacturing, and integrated circuits to understand the evolution of this technology.

Frequently Updated Research: Stay updated on advancements in semiconductor manufacturing techniques, memory device technology, and integrated circuit design to enhance the application of this innovation.

Questions about Line Contact Formation: 1. How does the two-stage removal process improve the formation of memory devices? 2. What are the potential challenges in maintaining a margin for shorts between signal lines in semiconductor manufacturing?


Original Abstract Submitted

a variety of applications can include an apparatus having a device including line contacts to closely-spaced conductive signal lines structured such that a sufficient margin for shorts between a signal line and a line contact to a directly adjacent signal line is maintained even with a misalignment of the line contact. in an embodiment, formation of a memory device can include forming a line contact on and contacting an access line for an array of memory cells, using a two stage removal procedure of different removal processes. the two stage removal procedure can include removing a portion of processing layers above an insulating protective layer positioned on the access line and selectively removing the insulating protective layer, exposing a portion of the access line, without removing material of the access line. the line contact can be formed on and contacting the top exposed portion of the access line.