Micron technology, inc. (20240290411). TOPOLOGY-BASED RETIREMENT IN A MEMORY SYSTEM simplified abstract
Contents
- 1 TOPOLOGY-BASED RETIREMENT IN A MEMORY SYSTEM
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 TOPOLOGY-BASED RETIREMENT IN A MEMORY SYSTEM - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Key Features and Innovation
- 1.6 Potential Applications
- 1.7 Problems Solved
- 1.8 Benefits
- 1.9 Commercial Applications
- 1.10 Questions about Topology-Based Retirement in Memory Systems
- 1.11 Original Abstract Submitted
TOPOLOGY-BASED RETIREMENT IN A MEMORY SYSTEM
Organization Name
Inventor(s)
Chun S. Yeung of San Jose CA (US)
Jonathan S. Parry of Boise ID (US)
TOPOLOGY-BASED RETIREMENT IN A MEMORY SYSTEM - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240290411 titled 'TOPOLOGY-BASED RETIREMENT IN A MEMORY SYSTEM
Simplified Explanation
The patent application describes methods, systems, and devices for topology-based retirement in a memory system. This involves evaluating error conditions in a memory array to infer defects and retire faulty portions.
- Memory system evaluates error conditions in memory array
- Infers defects such as short-circuits or open circuits
- Retires faulty portions based on detected errors
Key Features and Innovation
- Evaluation of error conditions in memory array
- Inference of defects like short-circuits or open circuits
- Retiring faulty portions based on detected errors
Potential Applications
This technology can be applied in various memory systems and devices to improve reliability and longevity by identifying and retiring defective portions.
Problems Solved
- Identifying defects in memory arrays
- Improving reliability and longevity of memory systems
- Efficient retirement of faulty portions
Benefits
- Enhanced reliability of memory systems
- Prolonged lifespan of memory devices
- Improved performance through efficient retirement of defective portions
Commercial Applications
Potential commercial applications include memory devices in consumer electronics, data centers, and other computing systems where reliability and longevity are crucial for optimal performance.
Questions about Topology-Based Retirement in Memory Systems
How does this technology improve the reliability of memory systems?
This technology improves reliability by identifying and retiring faulty portions in memory arrays, preventing potential errors and malfunctions.
What are the potential long-term benefits of implementing this topology-based retirement system in memory devices?
Implementing this system can lead to prolonged lifespan of memory devices, improved performance, and reduced maintenance costs over time.
Original Abstract Submitted
methods, systems, and devices for topology-based retirement in a memory system are described. in some examples, a memory system or memory device may be configured to evaluate error conditions relative to a physical or electrical organization of a memory array, which may support inferring the presence or absence of defects in one or more structures of a memory device. for example, based on various evaluations of detected errors, a memory system or a memory device may be able to infer a presence of a short-circuit, an open circuit, a dielectric breakdown, or other defects of a memory array that may be related to wear or degradation over time, and retire a portion of a memory array based on such an inference.
