Micron technology, inc. (20240248646). WORKLOAD-BASED SCAN OPTIMIZATION simplified abstract
Contents
WORKLOAD-BASED SCAN OPTIMIZATION
Organization Name
Inventor(s)
Kishore Kumar Muchherla of San Jose CA (US)
Eric N. Lee of San Jose CA (US)
Jeffrey S. Mcneil of Nampa ID (US)
Jonathan S. Parry of Boise ID (US)
Lakshmi Kalpana Vakati of Fremont CA (US)
WORKLOAD-BASED SCAN OPTIMIZATION - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240248646 titled 'WORKLOAD-BASED SCAN OPTIMIZATION
Simplified Explanation:
The method described in the patent application involves receiving multiple write operation requests for different memory units, each specifying operating characteristic values reflecting memory access operations. The method then checks if these values meet certain threshold criteria. If they do, the method performs multiple write operations to write data to the memory units and conducts a multiple-read scan operation to read data from each memory unit.
Key Features and Innovation:
- Method receives multiple write operation requests for memory units.
- Each request includes operating characteristic values reflecting memory access operations.
- Checks if these values meet threshold criteria.
- If criteria are met, performs multiple write operations to write data to memory units.
- Conducts a multiple-read scan operation to read data from each memory unit.
Potential Applications: The technology could be applied in various industries such as data storage, computer memory systems, and data processing.
Problems Solved: The technology addresses the need for efficient memory access operations and data writing processes.
Benefits:
- Improved memory access efficiency.
- Streamlined data writing processes.
- Enhanced data retrieval capabilities.
Commercial Applications: Title: "Efficient Memory Access Technology for Data Storage Systems" This technology could be utilized in data centers, cloud computing services, and high-performance computing systems to optimize memory operations and enhance overall system performance.
Prior Art: Readers can explore prior research on memory access optimization, data writing techniques, and memory unit scanning methods in the field of computer science and data storage technologies.
Frequently Updated Research: Researchers are constantly exploring new methods to improve memory access efficiency and data processing speed in various computing systems.
Questions about Memory Access Technology: 1. How does this technology improve data writing processes in memory units? 2. What are the potential implications of this technology for data storage systems?
Original Abstract Submitted
a method performed by a processing device receives a plurality of write operation requests, where each of the write operation requests specifies a respective one of the memory units, identifies one or more operating characteristic values, where each operating characteristic value reflects one or more memory access operations performed on a memory device, and determines whether the operating characteristic values satisfy one or more threshold criteria. responsive to determining that the operating characteristic values satisfy the one or more threshold criteria, the method performs a plurality of write operations, where each of the write operations writes data to the respective one of the memory units, and performs a multiple-read scan operation subsequent to the plurality of write operations, where the multiple-read scan operation reads data from each of the memory units.
