Micron technology, inc. (20240231993). CLASSIFYING AN AREA AS HAZARDOUS OR NON-HAZARDOUS BASED ON AN OPERATION OF A SEMICONDUCTOR DEVICE simplified abstract
Contents
CLASSIFYING AN AREA AS HAZARDOUS OR NON-HAZARDOUS BASED ON AN OPERATION OF A SEMICONDUCTOR DEVICE
Organization Name
Inventor(s)
Pavana Prakash of Houston TX (US)
Shashank Bangalore Lakshman of Folsom CA (US)
Saideep Tiku of Fort Collins CO (US)
CLASSIFYING AN AREA AS HAZARDOUS OR NON-HAZARDOUS BASED ON AN OPERATION OF A SEMICONDUCTOR DEVICE - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240231993 titled 'CLASSIFYING AN AREA AS HAZARDOUS OR NON-HAZARDOUS BASED ON AN OPERATION OF A SEMICONDUCTOR DEVICE
The present disclosure involves apparatuses, methods, and systems for classifying an area as hazardous or non-hazardous based on the operation of a semiconductor device. In one example, an apparatus includes a memory to store a global operation model and a processor to receive test data and operating data from a semiconductor device in an area, run the global operation model on the data to generate output data, and classify the area as hazardous or non-hazardous based on the output data.
- Memory stores global operation model
- Processor receives test data and operating data from semiconductor device
- Processor runs global operation model on data to generate output data
- Area classified as hazardous or non-hazardous based on output data
Potential Applications: - Industrial safety monitoring - Environmental hazard detection - Semiconductor manufacturing processes
Problems Solved: - Efficient classification of hazardous areas - Real-time monitoring of semiconductor device operations
Benefits: - Improved safety measures - Enhanced risk assessment capabilities - Streamlined decision-making processes
Commercial Applications: Title: Hazard Classification System for Semiconductor Devices This technology can be utilized in industries such as manufacturing, chemical processing, and semiconductor production to ensure workplace safety and compliance with regulations. The market implications include increased efficiency, reduced downtime, and improved overall operational safety.
Prior Art: Readers can explore prior research on semiconductor device safety systems, hazard classification methods, and real-time monitoring technologies in related industries.
Frequently Updated Research: Stay informed about the latest advancements in semiconductor device safety systems, hazard classification algorithms, and real-time monitoring tools to enhance workplace safety and operational efficiency.
Questions about Hazard Classification System for Semiconductor Devices: 1. How does this technology improve workplace safety in semiconductor manufacturing? This technology enhances workplace safety by accurately classifying hazardous areas based on semiconductor device operations, allowing for timely intervention and risk mitigation strategies.
2. What are the key features that set this hazard classification system apart from traditional safety monitoring systems? This system stands out due to its ability to analyze semiconductor device data in real-time, generate accurate hazard classifications, and provide actionable insights for safety management teams.
Original Abstract Submitted
the present disclosure includes apparatuses, methods, and systems for classifying an area as hazardous or non-hazardous based on an operation of a semiconductor device. in an example, an apparatus can include a memory configured to store a global operation model and a processor coupled to the memory wherein the processor is configured to receive test data and operating data from a semiconductor device based on operation of the semiconductor device in an area, run the global operation model on the test data and the operating data from the semiconductor device to generate output data, and classify the area as hazardous or non-hazardous based on the output data.
