Micron technology, inc. (20240231670). CROSS-COMPARISON OF DATA COPY PAIRS DURING MEMORY DEVICE INITIALIZATION simplified abstract

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CROSS-COMPARISON OF DATA COPY PAIRS DURING MEMORY DEVICE INITIALIZATION

Organization Name

micron technology, inc.

Inventor(s)

Angelo Covello of Avezzano AQ (IT)

Claudia Ciaschi of Latina LT (IT)

Michele Incarnati of Avezzano (IT)

Tommaso Vali of Sezze LT (IT)

CROSS-COMPARISON OF DATA COPY PAIRS DURING MEMORY DEVICE INITIALIZATION - A simplified explanation of the abstract

This abstract first appeared for US patent application 20240231670 titled 'CROSS-COMPARISON OF DATA COPY PAIRS DURING MEMORY DEVICE INITIALIZATION

The memory device described in the patent application includes a local memory for storing operational data and comparison logic that is connected to the local memory. During initialization, the comparison logic compares two pairs of copies of the operational data to detect errors.

  • The comparison logic checks a first copy pair (including a copy and an inverted copy) against a second copy pair (including a copy and an inverted copy) of the operational data.
  • If the first copy pair does not match the second copy pair, the comparison logic reports an error.

Potential Applications: - This technology could be used in computer systems to ensure the accuracy of stored data. - It may find applications in critical systems where data integrity is crucial, such as in aerospace or medical devices.

Problems Solved: - Ensures the accuracy and integrity of operational data stored in the memory device. - Provides a reliable method for error detection during initialization.

Benefits: - Enhances data reliability and integrity. - Helps prevent errors that could lead to system failures or malfunctions.

Commercial Applications: Title: Data Integrity Verification System This technology could be valuable in industries where data accuracy is paramount, such as in financial institutions, healthcare facilities, and government agencies. It could also be integrated into consumer electronics to improve data storage reliability.

Prior Art: Further research may be needed to identify prior art related to error detection and data integrity verification in memory devices.

Frequently Updated Research: Stay informed about advancements in error detection technologies and data integrity verification methods to enhance the performance of memory devices.

Questions about Memory Device Error Detection: 1. How does the comparison logic in the memory device detect errors in the operational data? The comparison logic compares two pairs of copies of the operational data to identify any discrepancies.

2. What are the potential implications of errors in operational data stored in memory devices? Errors in operational data could lead to system malfunctions, data corruption, or loss of critical information.


Original Abstract Submitted

a memory device includes a local memory to store operational data and comparison logic operatively coupled with the local memory. the comparison logic, upon initialization of the memory device, compares, to detect any errors in the operational data, one copy of a first copy pair with one copy of a second copy pair of the operational data, the first copy pair including a first copy and an inverted first copy and the second copy pair including a second copy and an inverted second copy of the operational data. the comparison logic further reports an error in response to detecting the first copy pair does not match the second copy pair.