Micron technology, inc. (20240231632). ADAPTIVE DIE SELECTION FOR BLOCK FAMILY SCAN simplified abstract
Contents
ADAPTIVE DIE SELECTION FOR BLOCK FAMILY SCAN
Organization Name
Inventor(s)
Kyungjin Kim of San Jose CA (US)
ADAPTIVE DIE SELECTION FOR BLOCK FAMILY SCAN - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240231632 titled 'ADAPTIVE DIE SELECTION FOR BLOCK FAMILY SCAN
The present disclosure involves configuring a system component, such as a memory sub-system controller, to perform adaptive die selection for block family scan operations. The controller assigns memory components to different groups based on their storage characteristics and determines the maximum quantity of memory components to perform block family scan operations at a given measurement period. The controller then distributes this maximum quantity across the assigned groups and performs the scan operations on a portion of the memory components.
- Adaptive die selection for block family scan operations
- Assigning memory components to groups based on storage characteristics
- Determining maximum quantity of memory components for scan operations
- Distributing the maximum quantity across assigned groups
- Performing block family scan operations on a portion of memory components
Potential Applications: - Memory management systems - Data storage devices - Semiconductor manufacturing
Problems Solved: - Efficient utilization of memory components - Improved performance in block family scan operations
Benefits: - Enhanced memory system efficiency - Optimal allocation of resources - Increased performance in scan operations
Commercial Applications: Title: "Optimized Memory Sub-System Controller for Enhanced Data Management" This technology can be utilized in various industries such as data centers, cloud computing, and IoT devices to improve memory management and data processing efficiency.
Questions about Adaptive Die Selection for Block Family Scan Operations: 1. How does the controller determine the maximum quantity of memory components for scan operations? The controller determines the maximum quantity based on the storage characteristics of the memory components and the individual measurement period.
2. What are the potential benefits of adaptive die selection in block family scan operations? Adaptive die selection allows for efficient utilization of memory components, leading to improved performance and resource allocation in scan operations.
Original Abstract Submitted
aspects of the present disclosure configure a system component, such as a memory sub-system controller, to perform adaptive die selection for block family scan operations. the controller assigns a set of memory components to one or more groups of a plurality of groups based on respective storage characteristics of the set of memory components, each of the plurality of groups corresponding to different storage characteristics. the controller determines a maximum quantity of memory components to perform block family (bf) scan operations at an individual measurement period. the controller distributes the maximum quantity of memory components across the one or more groups to which the set of memory components are assigned and, at the individual measurement period, performs the bf scan operations on a portion of the set of memory components corresponding to the maximum quantity of memory components.
