Micron technology, inc. (20240221857). METHODS AND SYSTEMS FOR REDUCING ECC POWER CONSUMPTION simplified abstract
Contents
METHODS AND SYSTEMS FOR REDUCING ECC POWER CONSUMPTION
Organization Name
Inventor(s)
Christophe Laurent of Agrate Brianza (IT)
METHODS AND SYSTEMS FOR REDUCING ECC POWER CONSUMPTION - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240221857 titled 'METHODS AND SYSTEMS FOR REDUCING ECC POWER CONSUMPTION
The present disclosure pertains to a method for operating an array of memory cells, involving storing user data in multiple memory cells of the array, storing parity data linked to the user data in a number of parity cells of the memory array, calculating an ECC syndrome from the stored data, determining the number of errors, and selecting an ECC correction capability based on the number of errors.
- Storing user data in memory cells
- Storing parity data in parity cells
- Calculating ECC syndrome
- Determining number of errors
- Selecting ECC correction capability
Potential Applications: - Data storage systems - Error correction in memory arrays - Information technology
Problems Solved: - Efficient error correction in memory arrays - Enhanced data reliability - Optimal data storage solutions
Benefits: - Improved data integrity - Enhanced error correction capabilities - Reliable data storage systems
Commercial Applications: Title: "Enhanced Error Correction Method for Memory Arrays" This technology can be utilized in various industries such as data storage, cloud computing, and telecommunications to ensure data integrity and reliability. It can also be integrated into consumer electronics for improved performance.
Prior Art: Readers can explore prior research on error correction codes, memory array operations, and data storage technologies to gain a deeper understanding of the innovation presented in this disclosure.
Frequently Updated Research: Researchers are constantly working on improving error correction methods for memory arrays to enhance data reliability and storage efficiency.
Questions about the Technology: 1. How does this method compare to traditional error correction techniques? 2. What are the potential scalability challenges of implementing this method in large memory arrays?
Original Abstract Submitted
the present disclosure relates to a method for operating an array of memory cells, the method comprising the steps of storing user data in a plurality of memory cells of the memory array, storing parity data associated with the user data in a number of parity cells of the memory array, the parity data corresponding to one of a plurality of selectable error correction code (ecc) correction capabilities from a minimum ecc correction capability to a maximum ecc correction capability, calculating an ecc syndrome from the stored user data and parity data, based on the ecc syndrome, determining a number of errors in the data, and, based on the determined number of errors, selecting an ecc correction capability of the plurality of ecc correction capabilities. related memory devices and systems are also herein disclosed.
