Micron technology, inc. (20240220132). Test Memory Sub-Systems through Validation of Responses to Proof of Space Challenges simplified abstract
Contents
Test Memory Sub-Systems through Validation of Responses to Proof of Space Challenges
Organization Name
Inventor(s)
Joseph Harold Steinmetz of Loomis CA (US)
Test Memory Sub-Systems through Validation of Responses to Proof of Space Challenges - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240220132 titled 'Test Memory Sub-Systems through Validation of Responses to Proof of Space Challenges
Simplified Explanation:
This patent application describes a memory sub-system, such as a solid-state drive (SSD), that can perform autonomous self-tests to evaluate the health of its memory cells by generating random challenges of proof of space and determining the validity of the responses stored in the memory cells.
- The memory sub-system includes a host interface for receiving read and write commands from an external host system.
- It has memory cells formed on at least one integrated circuit die.
- A processing device controls the execution of read commands to retrieve data from the memory cells and write commands to store data into the memory cells.
- During the autonomous self-test operation, the memory sub-system generates random challenges of proof of space and evaluates the health of the memory cells based on the validity of the responses stored in the memory cells.
Key Features and Innovation:
- Autonomous self-test operation for evaluating memory cell health.
- Generation of random challenges of proof of space.
- Use of proof of space plots to store responses in memory cells.
- Determination of validity of responses to assess memory cell health.
Potential Applications:
This technology can be applied in various industries such as data storage, cybersecurity, and computer hardware manufacturing.
Problems Solved:
- Ensures the reliability and health of memory cells in the memory sub-system.
- Provides a self-testing mechanism for early detection of memory cell issues.
Benefits:
- Improved reliability and performance of memory sub-systems.
- Early detection of memory cell issues for proactive maintenance.
- Enhanced data security through self-testing mechanisms.
Commercial Applications:
Potential commercial applications include data centers, cloud computing services, cybersecurity firms, and hardware manufacturers looking to enhance the reliability and performance of memory sub-systems.
Questions about Memory Sub-System Technology:
1. How does the autonomous self-test operation improve the reliability of memory sub-systems? 2. What are the potential implications of using proof of space plots for storing responses in memory cells?
Original Abstract Submitted
a memory sub-system, such as a solid-state drive (ssd), having host interface configured to receive at least read commands and write commands from an external host system. the ssd has memory cells formed on at least one integrated circuit die, and a processing device configured to control executions of the read commands to retrieve data from the memory cells and executions the write commands to store data into the memory cells. during an autonomous self-test operation of the memory sub-system, the memory sub-system is configured to generate random challenges of proof of space, generate using a proof of space plot, stored in the memory cells, responses to the random challenges respectively, and determine validity of the responses to evaluate health of the memory cells.
