Micron technology, inc. (20240201893). INPUT VOLTAGE DEGRADATION DETECTION simplified abstract
Contents
INPUT VOLTAGE DEGRADATION DETECTION
Organization Name
Inventor(s)
Sumit Tayal of Brentwood CA (US)
Joseph A. Oberle of Sunnyvale CA (US)
David C. Sastry of El Dorado Hills CA (US)
INPUT VOLTAGE DEGRADATION DETECTION - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240201893 titled 'INPUT VOLTAGE DEGRADATION DETECTION
The abstract of the patent application describes a method that involves testing the memory operation of a memory device in a memory sub-system and detecting input voltage or current using a sensor circuit. The method further includes determining if the input voltage or current meets degradation criteria and generating a management control signal based on this determination.
- Simplified Explanation:
- The method tests memory operation and monitors input voltage/current. - It checks if the input meets degradation criteria and generates a control signal.
- Key Features and Innovation:
- Self-initiated memory test with sensor circuit monitoring. - Criteria-based determination for input voltage/current. - Generation of management control signal based on degradation criteria.
- Potential Applications:
- Memory device quality control in electronic systems. - Preventing memory device failure due to degradation. - Enhancing overall performance and reliability of memory sub-systems.
- Problems Solved:
- Ensures memory device reliability by monitoring degradation. - Helps in early detection of potential memory failures. - Improves overall system performance and longevity.
- Benefits:
- Increased reliability and longevity of memory devices. - Enhanced system performance and reduced downtime. - Cost-effective maintenance and management of memory sub-systems.
- Commercial Applications:
- Title: "Memory Device Health Monitoring System" - Potential use in data centers, servers, and other electronic systems. - Market implications in the technology and semiconductor industries.
- Questions about Memory Device Health Monitoring System:
1. How does the method help in preventing memory device failures? - The method monitors input voltage/current to detect degradation, allowing for proactive maintenance. 2. What are the potential commercial applications of this technology? - The technology can be used in various electronic systems to enhance memory device reliability and performance.
Original Abstract Submitted
a method includes performing a self-initiated test memory operation of a memory device in a memory sub-system and detecting, via a sensor circuit, an input voltage or input current of the memory device or the memory sub-system. the method further includes determining whether the input voltage or the input current meets a degradation criteria and generating a management control signal responsive based on the determination whether the input voltage or the input current meets the degradation criteria.
