Micron technology, inc. (20240201891). INPUT VOLTAGE DEGRADATION DETECTION simplified abstract
Contents
INPUT VOLTAGE DEGRADATION DETECTION
Organization Name
Inventor(s)
Joseph A. Oberle of Sunnyvale CA (US)
David C. Sastry of El Dorado Hills CA (US)
Anil Kumar Agarwal of Boise ID (US)
Sumit Tayal of Brentwood CA (US)
INPUT VOLTAGE DEGRADATION DETECTION - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240201891 titled 'INPUT VOLTAGE DEGRADATION DETECTION
The abstract of the patent application describes a method that involves testing the memory device in a memory sub-system, detecting input voltage or current, determining if it meets degradation criteria, and generating a management control signal based on this determination.
- The method includes performing a host-initiated test memory operation of a memory device in a memory sub-system.
- It involves detecting an input voltage or input current of the memory device or the memory sub-system via a sensor circuit.
- The method determines whether the input voltage or input current meets a degradation criteria.
- It generates a management control signal based on the determination of whether the input voltage or input current meets the degradation criteria.
Potential Applications: - This technology can be used in memory systems to monitor and manage degradation of memory devices. - It can be applied in various electronic devices where memory sub-systems are utilized.
Problems Solved: - Helps in identifying degradation in memory devices or memory sub-systems. - Enables proactive management of memory performance based on degradation criteria.
Benefits: - Enhances the reliability and longevity of memory devices. - Allows for timely maintenance and replacement of memory components.
Commercial Applications: Title: Memory Degradation Management System This technology can be used in data centers, servers, and other electronic devices with memory systems to ensure optimal performance and longevity of memory devices. It can be marketed to manufacturers of memory components and electronic devices to improve overall product reliability.
Questions about Memory Degradation Management System: 1. How does this technology contribute to the overall efficiency of memory systems? - This technology helps in proactively managing memory degradation, ensuring optimal performance and reliability of memory devices. 2. What are the potential cost savings associated with using this memory degradation management system? - By identifying degradation early and allowing for timely maintenance, this system can help reduce unexpected failures and costly downtime in electronic devices.
Original Abstract Submitted
a method includes performing a host-initiated test memory operation of a memory device in a memory sub-system and detecting, via a sensor circuit, an input voltage or input current of the memory device or the memory sub-system. the method further includes determining whether the input voltage or the input current meets a degradation criteria and generating a management control signal responsive based on the determination whether the input voltage or the input current meets the degradation criteria.
