Micron technology, inc. (20240192875). REMAPPING BAD BLOCKS IN A MEMORY SUB-SYSTEM simplified abstract
Contents
- 1 REMAPPING BAD BLOCKS IN A MEMORY SUB-SYSTEM
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 REMAPPING BAD BLOCKS IN A MEMORY SUB-SYSTEM - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Key Features and Innovation
- 1.6 Potential Applications
- 1.7 Problems Solved
- 1.8 Benefits
- 1.9 Commercial Applications
- 1.10 Prior Art
- 1.11 Frequently Updated Research
- 1.12 Questions about Memory Error Management Systems
- 1.13 Original Abstract Submitted
REMAPPING BAD BLOCKS IN A MEMORY SUB-SYSTEM
Organization Name
Inventor(s)
Wenyen Chang of San Jose CA (US)
Aaron Lee of Sunnyvale CA (US)
Jiangli Zhu of San Jose CA (US)
REMAPPING BAD BLOCKS IN A MEMORY SUB-SYSTEM - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240192875 titled 'REMAPPING BAD BLOCKS IN A MEMORY SUB-SYSTEM
Simplified Explanation
The system described in the patent application involves a memory device with multiple memory planes and a processing device connected to it. The processing device is responsible for identifying and managing blocks of memory across the memory planes to address errors efficiently.
- The system identifies a group of blocks in a memory stripe that have a high number of errors.
- If the error count exceeds a certain threshold, the system maps the problematic blocks to a different memory stripe with fewer errors.
- This process helps optimize memory usage and maintain data integrity in the system.
Key Features and Innovation
- Utilizes multiple memory planes for efficient error management.
- Automatically maps problematic memory blocks to less error-prone areas.
- Enhances data integrity and system performance.
Potential Applications
This technology can be applied in:
- Solid-state drives (SSDs)
- Embedded systems
- Data centers
Problems Solved
- Efficient error management in memory devices.
- Optimization of memory usage.
- Enhanced data integrity.
Benefits
- Improved system reliability.
- Enhanced performance.
- Reduced data loss risks.
Commercial Applications
- "Memory Error Management System for Enhanced Data Integrity" can be utilized in various industries such as:
- Technology
- Data storage
- Information technology services
Prior Art
Further research can be conducted in the field of memory error management systems to explore existing technologies and innovations.
Frequently Updated Research
Stay updated on advancements in memory error management systems to ensure optimal performance and data integrity.
Questions about Memory Error Management Systems
How does the system determine the threshold for error counts in memory blocks?
The system uses predefined criteria to establish the threshold for error counts in memory blocks, ensuring efficient error management.
What are the potential implications of mapping memory blocks to different stripes on system performance?
Mapping memory blocks to different stripes can optimize memory usage and enhance system performance by reducing the impact of errors on data integrity.
Original Abstract Submitted
a system includes a memory device having a plurality of memory planes and a processing device operatively coupled with the memory device. the processing device to is perform operations including identifying a first block stripe of the memory device. the first block stripe includes a first plurality of blocks arranged across the plurality of memory planes. the operations further include determining that the first plurality of blocks of the first block stripe has greater than a threshold number of blocks associated with an error condition. responsive to determining that the first plurality of blocks has greater than the threshold number of blocks associated with the error condition, the operations further include mapping a block of the first plurality of blocks associated with the error condition to a second block stripe including a second plurality of blocks having fewer than the threshold number of blocks associated with the error condition.
