Micron technology, inc. (20240185931). PROGRAM VERIFY COMPENSATION IN A MEMORY DEVICE WITH A DEFECTIVE DECK simplified abstract
Contents
PROGRAM VERIFY COMPENSATION IN A MEMORY DEVICE WITH A DEFECTIVE DECK
Organization Name
Inventor(s)
Yu-Chung Lien of San Jose CA (US)
Zhenming Zhou of San Jose CA (US)
PROGRAM VERIFY COMPENSATION IN A MEMORY DEVICE WITH A DEFECTIVE DECK - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240185931 titled 'PROGRAM VERIFY COMPENSATION IN A MEMORY DEVICE WITH A DEFECTIVE DECK
The abstract of the patent application describes a process where a request is received to program a set of memory cells on a memory device. A defect indicator associated with the memory cells is determined to meet a defect condition, and a program verify parameter is set based on this indicator. The program operation is then carried out using this parameter during the program verify phase.
- Key Features and Innovation:
- Determination of defect indicator for memory cells - Setting program verify parameter based on defect indicator - Utilizing program verify parameter during program operation
- Potential Applications:
- Memory device programming - Quality control in memory cell programming - Error detection and correction in memory operations
- Problems Solved:
- Efficient programming of memory cells - Improved quality control in memory operations - Enhanced error detection capabilities
- Benefits:
- Increased reliability in memory operations - Streamlined programming process - Enhanced performance of memory devices
- Commercial Applications:
- Memory device manufacturing industry - Electronics and semiconductor companies - Quality control and testing equipment providers
- Prior Art:
- Any existing patents or technologies related to memory cell programming and defect detection
- Frequently Updated Research:
- Ongoing developments in memory device programming techniques - Latest advancements in defect detection in memory operations
Questions about memory cell programming and defect detection:
- Question 1: How does the determination of the defect indicator impact the programming process?
- The defect indicator helps in identifying memory cells that may not meet quality standards, allowing for appropriate adjustments during programming.
- Question 2: What are the potential implications of setting the program verify parameter based on the defect indicator?
- Setting the program verify parameter based on the defect indicator ensures that memory cells are programmed accurately and reliably, reducing the risk of errors in memory operations.
Original Abstract Submitted
a request to perform a program operation to program a set of memory cells on a memory device is received. a defect indicator associated with the set of memory cells is determined to satisfy a defect condition. a value of a program verify parameter is determined based on the defect indicator. the program operation is performed using the value of the program verify parameter during a program verify phase of the program operation.
