Micron technology, inc. (20240177760). PROBABILISTIC DATA INTEGRITY SCANS USING RISK FACTOR ESTIMATION simplified abstract
Contents
- 1 PROBABILISTIC DATA INTEGRITY SCANS USING RISK FACTOR ESTIMATION
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 PROBABILISTIC DATA INTEGRITY SCANS USING RISK FACTOR ESTIMATION - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Original Abstract Submitted
PROBABILISTIC DATA INTEGRITY SCANS USING RISK FACTOR ESTIMATION
Organization Name
Inventor(s)
Robert Winston Mason of Boise ID (US)
Phani Raghavendra Yasasvi Gangavarapu of Bengaluru (IN)
Pitamber Shukla of Boise ID (US)
PROBABILISTIC DATA INTEGRITY SCANS USING RISK FACTOR ESTIMATION - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240177760 titled 'PROBABILISTIC DATA INTEGRITY SCANS USING RISK FACTOR ESTIMATION
Simplified Explanation
The patent application describes methods, systems, and apparatuses for selecting a weighted subportion identifier for a portion of memory in a memory device based on a read counter satisfying a read threshold. The selection of the weighted subportion identifier is probabilistic, with the probability of selection based on defectivity information for subportions of memory within the portion. This identifier is then used to determine a subportion of memory on which a data validity scan is performed.
- Determining a read counter for a portion of memory
- Selecting a weighted subportion identifier based on the read counter and defectivity information
- Determining a subportion of memory using the weighted subportion identifier
- Performing a data validity scan on the selected subportion of memory
Potential Applications
This technology could be applied in the field of memory devices, particularly in improving data validity scans and optimizing memory usage.
Problems Solved
This technology helps in efficiently selecting subportions of memory for data validity scans, which can improve the overall performance and reliability of memory devices.
Benefits
The benefits of this technology include enhanced data validity scans, optimized memory usage, and improved reliability of memory devices.
Potential Commercial Applications
One potential commercial application of this technology could be in the manufacturing of memory devices for various electronic products, such as smartphones, tablets, and computers.
Possible Prior Art
One possible prior art could be the use of probabilistic methods in selecting memory subportions for data validity scans, although the specific combination of weighted subportion identifiers and defectivity information may be novel.
Unanswered Questions
How does this technology impact the speed of data validity scans in memory devices?
This technology could potentially improve the speed of data validity scans by efficiently selecting subportions of memory based on the read counter and defectivity information.
What are the potential limitations of using probabilistic methods in selecting memory subportions for data validity scans?
One potential limitation could be the complexity of implementing probabilistic selection algorithms in memory devices, which may require additional computational resources.
Original Abstract Submitted
methods, systems, and apparatuses include determining a read counter for a portion of memory of a memory device satisfies a read threshold. a weighted subportion identifier for the portion of memory is selected in response to the read counter satisfying the threshold. the weighted subportion identifier is selected probabilistically, a probability of selection based on defectivity information for subportions of memory of the portion of memory. a subportion of memory is determined using the weighted subportion identifier. a data validity scan is performed on the subportion of memory.
