Micron technology, inc. (20240176701). ENHANCED READ PERFORMANCE FOR MEMORY DATA WORD DECODING USING POWER ALLOCATION BASED ON ERROR PATTERN DETECTION simplified abstract

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ENHANCED READ PERFORMANCE FOR MEMORY DATA WORD DECODING USING POWER ALLOCATION BASED ON ERROR PATTERN DETECTION

Organization Name

micron technology, inc.

Inventor(s)

Nitul Gohain of Bangalore (IN)

Jameer Mulani of Mulani (IN)

Jonathan S. Parry of Boise ID (US)

ENHANCED READ PERFORMANCE FOR MEMORY DATA WORD DECODING USING POWER ALLOCATION BASED ON ERROR PATTERN DETECTION - A simplified explanation of the abstract

This abstract first appeared for US patent application 20240176701 titled 'ENHANCED READ PERFORMANCE FOR MEMORY DATA WORD DECODING USING POWER ALLOCATION BASED ON ERROR PATTERN DETECTION

Simplified Explanation

The patent application describes methods, systems, and devices to enhance read performance for memory data word decoding using power allocation based on error pattern detection in both QLC and TLC products. Here is a simplified explanation of the abstract:

  • A memory device processes data words using a decoder with different power settings.
  • The decoder detects error patterns in the data words and communicates a status signal based on the detected errors.
  • A resource manager allocates power credits to the decoder based on the status signal.
  • The decoder processes data words using the allocated power credits to improve read performance.

Potential Applications

This technology could be applied in various memory devices such as solid-state drives, smartphones, and other electronic devices requiring efficient memory data word decoding.

Problems Solved

1. Improved read performance for memory data word decoding. 2. Efficient power allocation based on error pattern detection.

Benefits

1. Enhanced reliability and speed in decoding data words. 2. Optimal power usage for improved performance. 3. Enhanced user experience with faster data access.

Potential Commercial Applications

Optimizing memory data word decoding in consumer electronics, data centers, and other industries could lead to faster and more reliable devices, attracting customers looking for high-performance products.

Possible Prior Art

Prior art in the field of memory devices may include techniques for error detection and correction, power management, and data decoding algorithms.

What are the specific error patterns detected by the decoder in the patent application?

The specific error patterns detected by the decoder in the patent application are not mentioned in the abstract. Further details on the types of error patterns and how they are identified could provide a deeper understanding of the technology's capabilities.

How does the resource manager determine the second amount of power credits allocated to the decoder?

The abstract does not specify the exact method by which the resource manager determines the second amount of power credits allocated to the decoder based on the status signal. Exploring this aspect further could shed light on the decision-making process behind power allocation in the system.


Original Abstract Submitted

methods, systems, and devices to enhance read performance for memory data word decoding using power allocation based on error pattern detection in both qlc and tlc in both qlc and tlc products are described. a plurality of data words may be processed using a first decoder engine of a decoder of a memory device according to a first power setting. the decoder may detect a pattern of errors in the plurality of data words. the decoder may further communicate a status signal based on detecting the pattern of errors. the resource manager may allocate based on the status signal, a second amount of power credits to the decoder. the decoder may process a portion of the plurality of data words using a second decoder engine according to the second amount of power credits.